Treffer 1 - 4 von 4 für Suche 'Barondeau, O.', Suchdauer: 0,50s Treffer weiter einschränken
  1. 1
    Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

    Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality von Beck, Matthias, Barondeau, Olivier, Kaibel, Martin, Poehl, Frank, Lin, Xijiang, Press, Ron


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  2. 2
    Measures to improve delay fault testing on low-cost testers - a case study

    Measures to improve delay fault testing on low-cost testers - a case study von Beck, M., Barondeau, O., Poehl, F., Xijiang Lin, Press, R.


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  3. 3
    Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment

    Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment von Faber, F.-U., Beck, M., Barondeau, O., Rabenalt, T., Gossel, M., Leininger, A.


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  4. 4
    The nickel and iron-sulfur centers in carbon monoxide dehydrogenase

    The nickel and iron-sulfur centers in carbon monoxide dehydrogenase von Xia, Jinqiang, Hu, Ed, Anderson, Mark E., Barondeau, David P., Russell, William K., Sinclair, James, Dong, Jun, Wang, Shengke, Scott, Robert A., Baldwin, Thomas O., Münck, Eckard, Lindahl, Paul A.


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