Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy protocol for the analysis of organic multilayers von Guyot, Claire, Barnes, Jean‐Paul, Renault, Olivier, Maindron, Tony

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Accelerating the development of phase‐change random access memory with in‐fab plasma profiling time‐of‐flight mass spectrometry von Nolot, Emmanuel, Mazel, Yann, Barnes, Jean‐Paul, Sabbione, Chiara, Navarro, Gabriele, Tempez, Agnes, Legendre, Sébastien

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Two-step cycling process alternating implantation and remote plasma etching for topographically selective etching: Application to Si3N4 spacer etching von Renaud, Vincent, Petit-Etienne, Camille, Barnes, Jean-Paul, Bisserier, Jérémie, Joubert, Olivier, Pargon, Erwine

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Role of the chemical composition and structure on the electrical properties of a solid state electrolyte: Case of a highly conductive LiPON von Le Van-Jodin, Lucie, Claudel, Arnaud, Secouard, Christophe, Sabary, Frédéric, Barnes, Jean-Paul, Martin, Steve

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Identifying exposition to low oxygen environment in human macrophages using secondary ion mass spectrometry and multivariate analysis von Court, Magali, Barnes, Jean‐Paul, Millet, Arnaud

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Multitechnique elemental depth profiling of InAlGaN and InAlN films von Mazel, Yann, Nolot, Emmanuel, Barnes, Jean-Paul, Charles, Matthew, Bouveyron, Romain, Mrad, Mrad, Tempez, Agnès, Legendre, Sébastien

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Halide Perovskite Precursors Dope PEDOT:PSS von Sandrez, Simon, Molenda, Zuzanna, Guyot, Claire, Renault, Olivier, Barnes, Jean‐Paul, Hirsch, Lionel, Maindron, Tony, Wantz, Guillaume

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Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application von Boussadi, Younes, Rochat, Névine, Barnes, Jean-Paul, Bakir, Badhise Ben, Ferrandis, Philippe, Masenelli, Bruno, Licitra, Christophe

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Anisotropic and low damage III-V/Ge heterostructure etching for multijunction solar cell fabrication with passivated sidewalls von de Lafontaine, Mathieu, Pargon, Erwine, Gay, Guillaume, Petit-Etienne, Camille, David, Sylvain, Barnes, Jean-Paul, Rochat, Névine, Jaouad, Abdelatif, Volatier, Maïté, Fafard, Simon, Aimez, Vincent, Darnon, Maxime

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Dopant profiling of focused ion beam milled semiconductors using off-axis electron holography; reducing artifacts, extending detection limits and reducing the effects of gallium im... von Cooper, David, Ailliot, Cyril, Barnes, Jean-Paul, Hartmann, Jean-Michel, Salles, Phillipe, Benassayag, Gerard, Dunin-Borkowski, Rafal E.

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Elemental Characterization of Al Nanoparticles Buried under a Cu Thin Film: TOF-SIMS vs STEM/EDX von Priebe, Agnieszka, Barnes, Jean-Paul, Edwards, Thomas Edward James, Huszár, Emese, Pethö, Laszlo, Michler, Johann

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Unifying natural and laboratory chemical weathering with interfacial dissolution–reprecipitation: A study based on the nanometer-scale chemistry of fluid–silicate interfaces von Hellmann, Roland, Wirth, Richard, Daval, Damien, Barnes, Jean-Paul, Penisson, Jean-Michel, Tisserand, Delphine, Epicier, Thierry, Florin, Brigitte, Hervig, Richard L.

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A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography von Priebe, Agnieszka, Audoit, Guillaume, Barnes, Jean-Paul

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Quantitative analysis of Si/SiGeC superlattices using atom probe tomography von Estivill, Robert, Grenier, Adeline, Duguay, Sébastien, Vurpillot, François, Terlier, Tanguy, Barnes, Jean-Paul, Hartmann, Jean-Michel, Blavette, Didier

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3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX von Priebe, Agnieszka, Barnes, Jean-Paul, Edwards, Thomas Edward James, Pethö, Laszlo, Balogh, István, Michler, Johann

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M-Plane Core–Shell InGaN/GaN Multiple-Quantum-Wells on GaN Wires for Electroluminescent Devices von Koester, Robert, Hwang, Jun-Seok, Salomon, Damien, Chen, Xiaojun, Bougerol, Catherine, Barnes, Jean-Paul, Dang, Daniel Le Si, Rigutti, Lorenzo, de Luna Bugallo, Andres, Jacopin, Gwénolé, Tchernycheva, Maria, Durand, Christophe, Eymery, Joël

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Ionic migrations during poling process in lanthanum aluminate investigated by time of flight-secondary ions mass spectrometry and piezoresponse force microscopy combined methodolog... von Moreno, Maiglid A., Chevalier, Nicolas, Barnes, Jean-Paul, Gautier, Brice

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Suppression of self-organized surface nanopatterning on GaSb/InAs multilayers induced by low energy oxygen ion bombardment by using simultaneously sample rotation and oxygen floodi... von Beainy, Georges, Cerba, Tiphaine, Bassani, Franck, Martin, Mickaël, Baron, Thierry, Barnes, Jean-Paul

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Combined ToF-SIMS and AFM protocol for accurate 3D chemical analysis and data visualization von Moreno, Maiglid A., Mouton, Isabelle, Chevalier, Nicolas, Barnes, Jean-Paul, Bassani, Franck, Gautier, Brice

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Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography von Beainy, Georges, Alcotte, Reynald, Bassani, Franck, Martin, Mickaël, Grenier, Adeline, Baron, Thierry, Barnes, Jean-Paul

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