The application of a low energy loss electron detector in conjunction with scanning Auger microscopy: an aid to quantitative surface microscopy von Barkshire, I.R, Roberts, R.H, Prutton, M

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Quantitative surface chemical mapping with Auger and backscattered electron signals von Prutton, M., Barkshire, I.R., Crone, M.

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Three-dimensional scatter diagrams: application to surface analytical microscopy von Kenny, P.G., Barkshire, I.R., Prutton, M.

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A miniature, all-electrostatic, field emission electron column for surface analytical microscopy von Roberts, R H, Gomati, M M El, Kudjoe, J, Barkshire, I R, Bean, S J, Prutton, M

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An examination of the use of principal component analysis and target factor analysis for the determination of Auger depth profiles in two magnetic multilayer metal systems-Cu/Co an... von Wenham, M. J. G., Barkshire, I. R., Prutton, M., Roberts, R. H., Wilkinson, D. K.

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Separation of sample geometry and material effects within the secondary electron cascade: Preliminary results for gold von Crone, M., Barkshire, I. R., Prutton, M.

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Multi-Imaging and Multivariate Statistics used for 3D Characterization at Surfaces von Prutton, M., Barkshire, I. R., Kenny, P. G., Roberts, R. H., Wenham, M.

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New technique for the simultaneous correction of topographical and backscattering artefacts in electron-excited Auger spectroscopy and microscopy von Crone, M., Barkshire, I. R., Prutton, M.

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Correction of backscattering effects in the quantification of Auger depth profiles von Barkshire, I. R., Prutton, M., Skinner, D. K.

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Automatic removal of substrate backscattering effects in Auger imaging and spectroscopy von Barkshire, I. R., Prutton, M., Greenwood, J. C., El Gomati, M. M.

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Multi-spectral scanning Auger microscopy of tribological surfaces von Barkshire, I.R., Prutton, M., Smith, G.C.

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Testing the success of analytical image correction routines: Surface images von Barkshire, I. R., Walton, J. M., Prutton, M.

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The use of metal/semiconductor structures to develop MULSAM analytical techniques von Prutton, M., Barkshire, I. R., El Gomati, M. M., Greenwood, J. C., Kenny, P. G., Roberts, R. H.

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Image correlation: Application to correction of beam current fluctuations in quantitative surface microscopy von Barkshire, I. R., Greenwood, J. C., Kenny, P. G., Prutton, M., Roberts, R. H., El Gomati, M. M.

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Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis von Barkshire, I.R., Kenny, P.G., Fletcher, I.W., Prutton, M.

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Al2Cu precipitate distribution in AlCu interconnects after electromigration stressing: A study by Auger microscopy and ion beam bevelling von Barkshire, I. R., Prutton, M.

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3D characterization of a W/TiN/ Ti/Si contact structure using MULSAM von Roberts, R. H., Prutton, M., Wilkinson, D. K., Barkshire, I. R., Hill, C. J., Pearson, P. J., Augustus, P. D., Skinner, D. K., Stribley, K.

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A third-generation Auger microscope using parallel multispectral data acquisition and analysis von Prutton, M., Walker, C. G. H., Greenwood, J. C., Kenny, P. G., Dee, J. C., Barkshire, I. R., Roberts, R. H., El. Gomati, M. M.

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Automatic and Interactive Correlation Partitioning Compared: Application to TiN/Ti/SiO2 von Haigh, S., Kenny, P. G., Roberts, R. H., Barkshire, I. R., Prutton, M., Skinner, D. K., Pearson, P., Stribley, K.

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Auger imaging from rough, chemically inhomogeneous, materials von CRONE, M, BARKSHIRE, I. R, PRUTTON, M, KENNY, P. G

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