An EPR study of defects in hydrogenated amorphous carbon thin films von Barklie, R.C., Collins, M., Cunniffe, J., Silva, S.R.P.

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Erratum to “Characterisation of defects in amorphous carbon by electron paramagnetic resonance”: [Diamond Relat. Mater. 10 (2001) 174–181] von Barklie, R.C.

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Characterisation of defects in amorphous carbon by electron paramagnetic resonance von Barklie, R.C.

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EPR characterization of defects in monoclinic powders of ZrO2 and HfO2 von WRIGHT, Sandra, BARKLIE, R. C

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Characterisation of defects in amorphous carbon by electron paramagnetic resonance von Barklie, R.C.

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EPR study of defects in as-received, γ-irradiated and annealed monoclinic HfO2 powder von WRIGHT, Sandra, FEENEY, S, BARKLIE, R. C

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Optimisation of the arc-discharge production of multi-walled carbon nanotubes von Cadek, M, Murphy, R, McCarthy, B, Drury, A, Lahr, B, Barklie, R.C, in het Panhuis, M, Coleman, J.N, Blau, W.J

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Nanostructure and paramagnetic centres in diamond-like carbon: Effect of Ar dilution in PECVD process von Jones, B.J., Wright, S., Barklie, R.C., Tyas, J., Franks, J., Reynolds, A.J.

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EPR characterization of defects in monoclinic powders of ZrO 2 and HfO 2 von Wright, Sandra, Barklie, R.C.

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EPR study of defects in as-received, γ-irradiated and annealed monoclinic HfO 2 powder von Wright, Sandra, Feeney, S., Barklie, R.C.

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Ge + ion implantation — a competing technology? von Hemment, P.L.F., Cristiano, F., Nejim, A., Lombardo, S., Larssen, K.K., Priolo, F., Barklie, R.C.

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Physical Doping of a Conjugated Polymer with Carbon Nanotubes von Coleman, J.N., Curran, S., Dalton, A.B., Davey, A.P., Mc Carthy, B., Blau, W., Barklie, R.C.

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Analysis of defects at the interface between high-k thin films and (100) silicon von Jones, B.J., Barklie, R.C.

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A comparative EPR study of ion implantation induced damage in Si, Si 1− xGe x ( x ≠ 0) and SiC von Barklie, R.C.

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EPR study of defects produced by MeV Ag ion implantation into silicon von O'Raifeartaigh, C., Barklie, R.C., Lindner, J.K.N.

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Characterisation of defects in thin films of hydrogenated amorphous carbon von Collins, M., Barklie, R.C., Anguita, J.V., Carey, J.D., Silva, S.R.P.

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Electronic properties of amorphous carbon nitride a-C1−xNx:H films investigated using vibrational and ESR characterisations von Lacerda, M, Lejeune, M, Jones, B.J, Barklie, R.C, Bouzerar, R, Zellama, K, Conway, N.M.J, Godet, C

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An EPR study at X- and W-band of defects in a-C:H films in the temperature range 5–300 K von Jones, B.J., Barklie, R.C., Smith, G., El Mkami, H., Carey, J.D., Silva, S.R.P.

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A comparative EPR study of ion implantation induced damage in Si, Si1−xGex (x ≠ 0) and SiC von Barklie, R.C.

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Electron paramagnetic resonance study of ion implantation induced defects in amorphous hydrogenated carbon von Jones, B.J., Barklie, R.C., Khan, R.U.A., Carey, J.D., Silva, S.R.P.

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