Pseudogap in a thin film of a conventional superconductor von Sacépé, Benjamin, Chapelier, Claude, Baturina, Tatyana I, Vinokur, Valerii M, Baklanov, Mikhail R, Sanquer, Marc

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Plasma processing of low-k dielectrics von Baklanov, Mikhail R., de Marneffe, Jean-Francois, Shamiryan, Denis, Urbanowicz, Adam M., Shi, Hualiang, Rakhimova, Tatyana V., Huang, Huai, Ho, Paul S.

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Disorder-induced inhomogeneities of the superconducting state close to the superconductor-insulator transition von Sacépé, B, Chapelier, C, Baturina, T I, Vinokur, V M, Baklanov, M R, Sanquer, M

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Low dielectric constant materials for microelectronics von Maex, K., Baklanov, M. R., Shamiryan, D., lacopi, F., Brongersma, S. H., Yanovitskaya, Z. S.

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Evaluation of Mechanical Properties of Porous OSG Films by PFQNM AFM and Benchmarking with Traditional Instrumentation von Ovchinnikov, I. S, Vishnevskiy, A. S, Seregin, D. S, Rezvanov, A. A, Schneider, D, Sigov, A. S, Vorotilov, K. A, Baklanov, M. R

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Atomic Layer Deposition of TiO2 on Surface Modified Nanoporous Low‑k Films von Levrau, Elisabeth, Devloo-Casier, Kilian, Dendooven, Jolien, Ludwig, Karl F, Verdonck, Patrick, Meersschaut, Johan, Baklanov, Mikhail. R, Detavernier, Christophe

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Localized superconductivity in the quantum-critical region of the disorder-driven superconductor-insulator transition in TiN thin films von Baturina, T I, Mironov, A Yu, Vinokur, V M, Baklanov, M R, Strunk, C

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Superinsulator and quantum synchronization von Vinokur, Valerii M, Baturina, Tatyana I, Fistul, Mikhail V, Mironov, Aleksey Yu, Baklanov, Mikhail R, Strunk, Christoph

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Porous low dielectric constant materials for microelectronics von Baklanov, Mikhail R, Maex, Karen

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Effect of Pore Structure of Nanometer Scale Porous Films on the Measured Elastic Modulus von Vanstreels, Kris, Wu, Chen, Gonzalez, Mario, Schneider, Dieter, Gidley, David, Verdonck, Patrick, Baklanov, Mikhail R

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Reentrant Resistive Behavior and Dimensional Crossover in Disordered Superconducting TiN Films von Postolova, Svetlana V., Mironov, Alexey Yu, Baklanov, Mikhail R., Vinokur, Valerii M., Baturina, Tatyana I.

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Intrinsic effect of porosity on mechanical and fracture properties of nanoporous ultralow- k dielectrics von Vanstreels, K., Wu, C., Verdonck, P., Baklanov, M. R.

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Superconducting phase transitions in ultrathin TiN films von Baturina, T. I, Postolova, S. V, Mironov, A. Yu, Glatz, A, Baklanov, M. R, Vinokur, V. M

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Influence of absorbed water components on SiOCH low- k reliability von Li, Yunlong, Ciofi, Ivan, Carbonell, Laureen, Heylen, Nancy, Van Aelst, Joke, Baklanov, Mikhaïl R., Groeseneken, Guido, Maex, Karen, Tőkei, Zsolt

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Defect-induced bandgap narrowing in low-k dielectrics von Guo, X., Zheng, H., King, S. W., Afanas'ev, V. V., Baklanov, M. R., de Marneffe, J.-F., Nishi, Y., Shohet, J. L.

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Nanoscale Noncontact Subsurface Investigations of Mechanical and Optical Properties of Nanoporous Low-k Material Thin Film von Lomonosov, Alexey M, Ayouch, Adil, Ruello, Pascal, Vaudel, Gwenaelle, Baklanov, Mikhail R, Verdonck, Patrick, Zhao, Larry, Gusev, Vitalyi E

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Metal-Organic Framework ZIF‑8 Films As Low‑κ Dielectrics in Microelectronics von Eslava, Salvador, Zhang, Liping, Esconjauregui, Santiago, Yang, Junwei, Vanstreels, Kris, Baklanov, Mikhail R, Saiz, Eduardo

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Damage free integration of ultralow-k dielectrics by template replacement approach von Zhang, L., de Marneffe, J.-F., Heylen, N., Murdoch, G., Tokei, Z., Boemmels, J., De Gendt, S., Baklanov, M. R.

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In Situ Monitoring of Atomic Layer Deposition in Nanoporous Thin Films Using Ellipsometric Porosimetry von Dendooven, Jolien, Devloo-Casier, Kilian, Levrau, Elisabeth, Van Hove, Robbert, Pulinthanathu Sree, Sreeprasanth, Baklanov, Mikhail R, Martens, Johan A, Detavernier, Christophe

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Quantum metallicity on the high-field side of the superconductor-insulator transition von Baturina, T I, Strunk, C, Baklanov, M R, Satta, A

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