Compact Modeling of MOSFET I – V Characteristics and Simulation of Dose-Dependent Drain Currents von Zebrev, Gennady I., Orlov, Vasily V., Bakerenkov, Alexander S., Felitsyn, Vladislav A.

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ELDRS Susceptibility of Bipolar Transistors and Integrated Circuits During Low-Temperature Irradiation von Bakerenkov, Alexander S., Pershenkov, Viacheslav S., Felitsyn, Vladislav A., Rodin, Alexander S., Telets, Vitaly A., Belyakov, Vladimir V., Shurenkov, Vladimir V.

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Enhanced low dose rate sensitivity (ELDRS) and reduced low dose rate sensitivity (RLDRS) in bipolar devices von Pershenkov, Vyacheslav, Bakerenkov, Alexander, Rodin, Alexander, Felitsyn, Vladislav, Zhukov, Alexander, Telets, Vitaly, Belyakov, Vladimir

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Effect of Temperature and Electrical Modes on Radiation Sensitivity of MISFET Dose Sensors von Boris Podlepetsky, Viacheslav Pershenkov, Alexander Bakerenkov, Vladislav Felitsyn, Alexander Rodin

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Equipment and Test Results of the Electronic Components to SEE in the Temperature Range von Anashin, V. S., Kozyukov, A. E., Emeliyanov, V. V., Ozerov, A. I., Vatuev, A. S., Besetskiy, A. V., Skuratov, V. A., Bakerenkov, A. S., Belyakov, V. V.

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Ionizing Radiation Dose Sensor Based on n-channel MOSFET von Podlepetsky, B. I., Pershenkov, V. S., Belyakov, V. V., Bakerenkov, A. S., Felitsyn, V., Rodin, Alexander S.

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