Varifocal MEMS mirrors for high-speed axial focus scanning: a review von Pribošek, Jaka, Bainschab, Markus, Sasaki, Takashi

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Particle number measurements within periodic technical inspections: A first quantitative assessment of the influence of size distributions and the fleet emission reduction von Bainschab, Markus, Schriefl, Mario A., Bergmann, Alexander

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On the Inherent Variability of Particulate Matter Concentrations on Small Scales and the Consequences for Miniaturized Particle Sensors von Paul Maierhofer, Georg Röhrer, Markus Bainschab, Alexander Bergmann

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Spatial and directional contrast dependence in Lissajous-scanning projection systems von Bainschab, Markus, Pribošek, Jaka

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Analytical modeling and optimization of electrostatic particle sensors for particle number detection: incorporating particle size influence von Wallner, Tanja, Bainschab, Markus, Kubicka, Manuel, Klambauer, Reinhard, Bergmann, Alexander

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Additive Manufacturing-Enabled Low-Cost Particle Detector von Wallner, Tanja, Bainschab, Markus, Klambauer, Reinhard, Bergmann, Alexander

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Aerosol gas exchange system (AGES) for nanoparticle sampling at elevated temperatures: Modeling and experimental characterization von Bainschab, Markus, Martikainen, Sampsa, Keskinen, Jorma, Bergmann, Alexander, Karjalainen, Panu

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An Intrinsically Pressure Insensitive Low Cost Particle Number Diluter Featuring Flow Monitoring von Markus Bainschab, Alexander Bergmann

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Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films von Resel, Roland, Bainschab, Markus, Pichler, Alexander, Dingemans, Theo, Simbrunner, Clemens, Stangl, Julian, Salzmann, Ingo

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Disentangling Multichannel Photodissociation Dynamics in Acetone by Time-Resolved Photoelectron–Photoion Coincidence Spectroscopy von Maierhofer, Paul, Bainschab, Markus, Thaler, Bernhard, Heim, Pascal, Ernst, Wolfgang E, Koch, Markus

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A Comprehensive Characterization Procedure for Resonant MEMS Scanning Mirrors von Clement Fleury, Markus Bainschab, Gianluca Mendicino, Roberto Carminati, Pooja Thakkar, Dominik Holzmann, Sara Guerreiro, Adrien Piot

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Measuring Sub-23 Nanometer Real Driving Particle Number Emissions Using the Portable DownToTen Sampling System von Bainschab, Markus, Landl, Lukas, Andersson, Jon, Mamakos, Athanasios, Hausberger, Stefan, Bergmann, Alexander

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Measuring Sub-23 Nanometer Real Driving Particle Number Emissions Using the Portable DownToTen Sampling System von Bainschab, Markus, Landl, Lukas, Andersson, Jon, Mamakos, Athanasios, Hausberger, Stefan, Bergmann, Alexander

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PARTICLE MAGNIFIER AND PARTICLE COUNTER FOR PARTICLES IN A FLOW von BERGMANN, Alexander, BAINSCHAB, Markus

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PARTICLE MAGNIFIER AND PARTICLE COUNTER FOR PARTICLES IN A FLOW von BERGMANN, Alexander, BAINSCHAB, Markus

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Lissajous projection contrast variance: Test pattern phase angle and location von Bainschab, Markus, Pribosek, Jaka

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PARTICLE MAGNIFIER AND PARTICLE COUNTER FOR PARTICLES IN A FLOW von BERGMANN, Alexander, BAINSCHAB, Markus

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Semi-Volatile Particulate Matter Detection von Giannopoulos, George, Bainschab, Markus, Bergmann, Alexander, Boies, Adam

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SEMI-VOLATILE PARTICULATE MATTER DETECTION von BERGMANN, Alexander, BOIES, Adam, GIANNOPOULOS, George, BAINSCHAB, Markus

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SEMI-VOLATILE PARTICULATE MATTER DETECTION von BERGMANN, Alexander, BOIES, Adam, GIANNOPOULOS, George, BAINSCHAB, Markus

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