Probing the energy levels of perovskite solar cells via Kelvin probe and UV ambient pressure photoemission spectroscopy von Harwell, J R, Baikie, T K, Baikie, I D, Payne, J L, Ni, C, Irvine, J T S, Turnbull, G A, Samuel, I D W

Volltext

Work function analysis of gas sensitive WO3 layers with Pt doping von Halek, G., Baikie, I.D., Teterycz, H., Halek, P., Suchorska-Woźniak, P., Wiśniewski, K.

Volltext

Preferential island nucleation at the elbows of the Au(111) herringbone reconstruction through place exchange von Meyer, J.A., Baikie, I.D., Kopatzki, E., Behm, R.J.

Volltext

Low cost PC based scanning Kelvin probe von Baikie, I. D., Estrup, P. J.

Volltext

Comparison of scanning Kelvin probe with SEM/EPMA techniques for fingermark recovery from metallic surfaces von Challinger, S.E., Baikie, I.D., Flannigan, G., Halls, S., Laing, K., Daly, L., Nic Daeid, N.

Volltext

Multitip scanning bio-Kelvin probe von Baikie, I. D., Smith, P. J. S., Porterfield, D. M., Estrup, P. J.

Volltext

Noise and the Kelvin method von Baikie, I. D., Mackenzie, S., Estrup, P. J. Z., Meyer, J. A.

Volltext

Study of high- and low-work-function surfaces for hyperthermal surface ionization using an absolute Kelvin probe von Baikie, I. D., Peterman, U., Lägel, B., Dirscherl, K.

Volltext

Kelvin probe and ultraviolet photoemission measurements of indium tin oxide work function: a comparison von Kim, J.S., Lägel, B., Moons, E., Johansson, N., Baikie, I.D., Salaneck, W.R., Friend, R.H., Cacialli, F.

Volltext

Combined work function and STM study on growth, alloying and oxidation of epitaxial aluminum films on Ru(0001) von Kopatzki, E., Keck, H.-G., Baikie, I.D., Meyer, J.A., Behm, R.J.

Volltext

Analysis of stray capacitance in the Kelvin method von Baikie, I. D., Venderbosch, E., Meyer, J. A., Estrup, P. J. Z.

Volltext

Probing the energy levels of perovskite solar cells via Kelvin probe and UV ambient pressure photoemission spectroscopyElectronic supplementary information (ESI) available. See DOI... von Harwell, J. R, Baikie, T. K, Baikie, I. D, Payne, J. L, Ni, C, Irvine, J. T. S, Turnbull, G. A, Samuel, I. D. W

Volltext

A novel detection system for defects and chemical contamination in semiconductors based upon the Scanning Kelvin Probe von Lägel, B., Baikie, I.D., Petermann, U.

Volltext

Work function study of rhenium oxidation using an ultra high vacuum scanning Kelvin probe von Baikie, I. D., Petermann, U., Speakman, A., Lägel, B., Dirscherl, K. M., Estrup, P. J.

Volltext

Automatic kelvin probe compatible with ultrahigh vacuum von Baikie, I. D., van der Werf, K. O., Oerbekke, H., Broeze, J., van Silfhout, A.

Volltext

In situ work function study of oxidation and thin film growth on clean surfaces von Baikie, I.D, Petermann, U, Lägel, B

Volltext

Integrated automatic modular measuring system von Baikie, I. D., van der Werf, K. O., Hanekamp, L. J.

Volltext

Kelvin probe study of metastable states during initial oxygen adsorption dynamics on Si(111) 7×7 von Petermann, U., Baikie, I.D., Lägel, B.

Volltext

Kelvin probe study of metastable states during initial oxygen adsorption dynamics on Si(111) 7x7 von Petermann, U, Baikie, I D, Lagel, B

Volltext

A novel detection system for defects and chemical contamination in semiconductors based upon the Scanning Kelvin Probe von LÄGEL, B, BAIKIE, I. D, PETERMANN, U

Volltext