Electro-thermal simulation of metal interconnections under high current flow von Bagnoli, P.E., Zhang, Y.

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Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization-Part I : Fundamentals and theory von BAGNOLI, P. E, CASAROSA, C, CIAMPI, M, DALLAGO, E

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Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization-PART II : Practice and experiments von BAGNOLI, P. E, CASAROSA, C, DALLAGO, E, NARDONI, M

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Electromigration and low-frequency resistance fluctuations in aluminum thin-film interconnections von Neri, B., Diligenti, A., Bagnoli, P.E.

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Characterization of YSZ films by means of C- V measurements and TEM observations von Bagnoli, P.E., Ciofi, C., Diligenti, A., Innamorato, A., Nannini, A.

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Electromigration in Al based stripes: Low frequency noise measurements and MTF tests von Bagnoli, P.E., Ciofi, C., Neri, B., Pennelli, G.

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A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique von Diligenti, A., Bagnoli, P.E., Neri, B., Bea, S., Mantellassi, L.

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Electromigration detection by means of low-frequency noise measurements in thin-film interconnections von Diligenti, A., Neri, B., Bagnoli, P.E., Barsanti, A., Rizzo, M.

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Effective acceptor profiles in chemically and plasma treated WNX/GaAs Shannon contacts from capacitance and current measurements von BAGNOLI, P. E, PACCAGNELLA, A, CALLEGARI, A

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Electrical characteristics of silicon nitride on silicon and InGaAs as a function of the insulator stoichiometry von Bagnoli, P.E., Piccirillo, A., Gobbi, A.L., Giannetti, R.

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Silicon nitride/semiconductor interface state density as a function of the insulator stoichiometry von Bagnoli, P.E., Piccirillo, A., Valenti, P., Civale, G., Gobbi, A.L.

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On the capacitance of metal/thin oxide/semiconductor structures with localized oxide states von Nannini, A., Bagnoli, P.E.

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Photoluminescence investigation of III-V semiconductor surface damage induced by PECVD silicon nitride films von Piccirillo, A., Marzano, R., Gobbi, A.L., Bagnoli, P.E.

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Noise measurements in thin-film interconnections: a nondestructive technique to characterize electromigration von BAGNOLI, P. E, DILIGENTI, A, NERI, B, CIUCCI, S

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Effects of interfacial states on the capacitance-voltage characteristics of Pd/SiO2/n-Si Schottky diodes von BAGNOLI, P. E, NANNINI, A

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Identification of silicon nitride/InGaAs interface states von PICCIRILLO, A, GOBBI, A. L, FERRARIS, M, GIANNETTI, R, BAGNOLI, P. E

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Thermal analysis of insulated metal substrates for automotive electronic assemblies von Di Pascoli, S, Bagnoli, P.E, Casarosa, C

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Alkaline ion sensitivity of insulator-silicon structures with glass membranes prepared by the sol-gel technique von BAGNOLI, P. E, GUGLIELMI, M, COLOMBO, P

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Erbium-doped fiber lasers as deep-sea hydrophones von Bagnoli, P.E., Beverini, N., Bouhadef, B., Castorina, E., Falchini, E., Falciai, R., Flaminio, V., Maccioni, E., Morganti, M., Sorrentino, F., Stefani, F., Trono, C.

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Electrothermal Simulation of the Hot-Spot and Its Countermeasures in Cellular Bipolar Power Transistors von Bagnoli, P.E., Stefani, F.

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