Acceleration factors for thin oxide breakdown von MCPHERSON, J. W, BOGLEE, D. A

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Reduced hot-electron effects in MOSFET's with an optimized LDD Structure von Baglee, D.A., Duvvury, C.

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Improvement in very thin gate oxide integrity by ion implantation von Baglee, D.A.

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Lightly doped drain transistors for advanced VLSI circuits von Baglee, D.A., Duvvury, C., Smayling, M.C., Duane, M.P.

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Statistical bin limits-an approach to wafer disposition in IC fabrication von Illyes, S., Baglee, D.A.G.

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Scaled LOCOS processes with reduced narrow width effects von BAGLEE, D. A, SMAYLING, M. C, DUANE, M. P, ITOH, M

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Comments on "Source-and-drain series resistance of LDD MOSFET's" von Duvvury, C., Baglee, D.A.G., Duane, M.P.

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A High Performance 1μm CMOS Process for VLSI Applications von Doering, R. R., Duane, M. P., McDavid, J. M., Baglee, D. A., Clark, D., Crank, S., Armstrong, G. J.

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Building-in reliability: making it work von Schafft, H.A., Baglee, D.A., Kennedy, P.E.

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Condition Monitoring in the Advances of Industry 4.0—Case Study von Shaalan, Abdu, Baglee, David

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A new mission: Mainstreaming climate adaptation in the US Department of Defense von Garfin, Gregg, Falk, Donald A., O'Connor, Christopher D., Jacobs, Katharine, Sagarin, Raphael D., Haverland, Arin C., Haworth, Anna, Baglee, Alastair, Weiss, Jeremy, Overpeck, Jonathan, Zuñiga-Terán, Adriana A.

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Condition Management of Marine Lube Oil and the Role of Intelligent Sensor Systems in Diagnostics von Knowles, M, Baglee, D

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Developing RCM Strategy for Hydrogen Fuel Cells Utilizing On Line E-Condition Monitoring von Baglee, D, Knowles, M J

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The measurement of maintenance function efficiency through financial KPIs von Galar, D, Parida, A, Kumar, U, Baglee, D, Morant, A

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Value stream mapping: A dairy industry prospective von Melvin, A., Baglee, D.

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An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices von Duvvury, Charvaka, Baglee, Dave, Duane, Michael, Hyslop, Adin, Smayling, Michael, Maekawa, Mike

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Thickness and field dependence of defects in silicon dioxide von Baglee, D., Zakzouk, A.K., Eccleston, W., Stuart, R.A.

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An analytical method for determining intrinsic drainsource resistance of lightly doped drain (LDD) devices von CHARVAKA DUVUURY, BAGLEE, D, DUANE, M, HYSLOP, A, SMAYLING, M, MAEKAWA, M

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