Comprehensive Study of Cross-Section Dependent Effective Masses for Silicon Based Gate-All-Around Transistors von Badami, Oves, Medina-Bailon, Cristina, Berrada, Salim, Carrillo-Nunez, Hamilton, Lee, Jaeyhun, Georgiev, Vihar, Asenov, Asen

Volltext

TCAD Analysis of O-Terminated Diamond m-i-p+ Diode Characteristics Dependencies on Surface States CNL and Metal-Induced Gap States von Pullaiah, Yerragudi, Bajaj, Mohit, Badami, Oves, Nayak, Kaushik

Volltext

Insights into Sub‐Thermionic Transport in Schottky Barrier FETs von Gauhar, Ghulam Ali, Bhattacharjee, Shubhadeep, Badami, Oves

Volltext

Ga-polar GaN Camel diode enabled by a low-cost Mg-diffusion process von Sarkar, Biplab, Wang, Jia, Badami, Oves, Pramanik, Tanmoy, Kwon, Woong, Watanabe, Hirotaka, Amano, Hiroshi

Volltext

Study of gate current in advanced MOS architectures von Gauhar, Ghulam Ali, Chenchety, Abhishek, Yenugula, Hashish, Georgiev, Vihar, Asenov, Asen, Badami, Oves

Volltext

KMC-based POM flash cell optimization and time-dependent performance investigation von Ding, Jie, Mu, Dejiang, Badami, Oves, Medina-Bailon, Cristina, Chang, Xiaomin, Nagy, Daniel, Lapham, Paul, Georgiev, Vihar, Asenov, Asen

Volltext

Publisher's Note: "Tunneling-triggered bipolar action in junctionless tunnel field-effect transistor" von Gundapaneni, Suresh, Goswami, Aranya, Badami, Oves, Cuduvally, Ramya, Konar, Aniruddha, Bajaj, Mohit, Murali, Kota V. R. M.

Volltext

Nano-electronic Simulation Software (NESS): a flexible nano-device simulation platform von Berrada, Salim, Carrillo-Nunez, Hamilton, Lee, Jaehyun, Medina-Bailon, Cristina, Dutta, Tapas, Badami, Oves, Adamu-Lema, Fikru, Thirunavukkarasu, Vasanthan, Georgiev, Vihar, Asenov, Asen

Volltext

Variability Predictions for the Next Technology Generations of n -type Si x Ge 1- x Nanowire MOSFETs von Lee, Jaehyun, Badami, Oves, Carrillo-Nuñez, Hamilton, Berrada, Salim, Medina-Bailon, Cristina, Dutta, Tapas, Adamu-Lema, Fikru, Georgiev, Vihar P, Asenov, Asen

Volltext

Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs von Sadi, Toufik, Badami, Oves, Georgiev, Vihar, Asenov, Asen

Volltext