X-Ray Imaging Spectrometer (XIS) on Board Suzaku von Koyama, Katsuji, Tsunemi, Hiroshi, Dotani, Tadayasu, Bautz, Mark W., Hayashida, Kiyoshi, Tsuru, Takeshi Go, Matsumoto, Hironori, Ogawara, Yoshiaki, Ricker, George R., Doty, John, Kissel, Steven E., Foster, Rick, Nakajima, Hiroshi, Yamaguchi, Hiroya, Mori, Hideyuki, Sakano, Masaaki, Hamaguchi, Kenji, Nishiuchi, Mamiko, Miyata, Emi, Torii, Ken’ichi, Namiki, Masaaki, Katsuda, Satoru, Matsuura, Daisuke, Miyauchi, Tomofumi, Anabuki, Naohisa, Tawa, Noriaki, Ozaki, Masanobu, Murakami, Hiroshi, Maeda, Yoshitomo, Ichikawa, Yoshinori, Prigozhin, Gregory Y., Boughan, Edward A., LaMarr, Beverly, Miller, Eric D., Burke, Barry E., Gregory, James A., Pillsbury, Allen, Bamba, Aya, Hiraga, Junko S., Senda, Atsushi, Katayama, Haruyoshi, Kitamoto, Shunji, Tsujimoto, Masahiro, Kohmura, Takayoshi, Tsuboi, Yohko, Awaki, Hisamitsu

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CCD Charge Injection Structure at Very Small Signal Levels von Prigozhin, G., Burke, B., Bautz, M., Kissel, S., LaMarr, B.

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Design and Simulation of a Highly Sensitive Charge Detector With Nondestructive Readout Mode for Fully Depleted Thick CCDs von Sofo-Haro, Miguel, Donlon, Kevan, Burke, Barry, Estrada, Juan, Fahim, Farah, Leitz, Chris

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Measuring Technology and Engineering Literacy in the Engineering by Design™ Classroom von Huffman, Tanner, Burke, Barry

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The ITEEA 6E Learning ByDesign™ Model: Maximizing Informed Design and Inquiry in the Integrative STEM Classroom von Burke, Barry N

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Direct detection of nucleic acid hybridization on the surface of a charge coupled device von Lamture, Jagannath B., LBeattie, Kenneth, Burke, Barry E., Eggers, Mitchell D., Ehrlich, Dan J., Fowler, Rick, Hollis, Mark A., Kosicki, Bernard B., Reich, Robert K., Smith, Sean R., Varma, Rajender S., Hogan, Michael E.

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Multiport-readout frame-transfer 5 megapixel CCD imaging system for TEM applications von Fan, G.Y, Peltier, S, Lamont, S, Dunkelberger, Dana G, Burke, Barry E, Ellisman, Mark H

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Silicon-on-Insulator-Based Single-Chip Image Sensors: Low-Voltage Scientific Imaging von Suntharalingam, Vyshnavi, Burke, Barry E., Cooper, Michael J.

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An Assessment Model for a Design Approach to Technological Problem Solving von Custer, Rodney L., Valesey, Brigitte G., Burke, Barry N.

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Pioneers-- The Engineering by Design Network von Burke, Barry N

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CCD Technology von Burke, Barry, Jorden, Paul, Vu, Paul

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FlyEyes: A CCD-based Wavefront Sensor for PUEO, the CFHT Curvature AO System von Lai, Olivier, Cuillandre, Jean-Charles, Ho, Kevin K. Y., Baril, Marc, Benedict, Tom, Ward, Jeff, Thomas, Jim, Salmon, Derrick, Lin, Chueh-Jen, Wang, Shiang-Yu, Luppino, Gerry, Dorn, Reinhold, Puget, Pascal, Burke, Barry, Beletic, James

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SEVEN SECRETS FOR TEACHERS TO SURVIVE IN AN AGE OF SCHOOL REFORM von Burke, Barry N

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WHY CATTS NEEDS SPACE! STANDARDS-BASED TECHNOLOGY CURRICULA FOR STANDARDS-BASED TECHNOLOGY PROGRAMS von Burke, Barry N

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Measuring technology and engineering literacy in the engineering byDesign[TM] classroom: part one of three: assessment development von Huffman, Tanner, Burke, Barry

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The Finest in Professional Development: Engineering byDesign (EbD) Curriculum Specialists--Helping Hands for Improving Student Achievement von Burke, Barry N, Meade, Shelli D

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The Orthogonal Transfer CCD von Tonry, John L., Burke, Barry E., Schechter, Paul L.

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Development and characterization of a fast and low noise readout for the next generation X-ray CCDs von Chattopadhyay, Tanmoy, Herrmann, Sven, Orel, Peter, Morris, R Glenn, Prigozhin, Gregory, Malonis, Andrew, Foster, Richard, Craig, David, Burke, Barry E, Allen, Steven W, Bautz, Marshall

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An abuttable CCD imager for visible and X-ray focal plane arrays von Burke, B.E., Mountain, R.W., Harrison, D.C., Bautz, M.W., Doty, J.P., Ricker, G.R., Daniels, P.J.

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Measurement and simulation of charge diffusion in a small-pixel charge-coupled device von LaMarr, Beverly J, Prigozhin, Gregory Y, Miller, Eric D, Thayer, Carolyn, Bautz, Marshall W, Foster, Richard, Grant, Catherine E, Malonis, Andrew, Burke, Barry E, Cooper, Michael, Donlon, Kevan, Leitz, Christopher

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