Impact of Tellurium Precipitates in CdZnTe Substrates on MBE HgCdTe Deposition von Benson, J. D., Bubulac, L. O., Smith, P. J., Jacobs, R. N., Markunas, J. K., Jaime-Vasquez, M., Almeida, L. A., Stoltz, A., Wijewarnasuriya, P. S., Brill, G., Chen, Y., Peterson, J., Reddy, M., Vilela, M. F., Johnson, S. M., Lofgreen, D. D., Yulius, A., Bostrup, G., Carmody, M., Lee, D., Couture, S.

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The Distribution Tail of LWIR HgCdTe-on-Si FPAs: a Hypothetical Physical Mechanism von Bubulac, L. O., Benson, J.D., Jacobs, R.N., Stoltz, A.J., Jaime-Vasquez, M., Almeida, L. A., Wang, A., Wang, L., Hellmer, R., Golding, T., Dinan, J.H., Carmody, M., Wijewarnasuriya, P.S., Lee, M.F., Vilela, M.F., Peterson, J., Johnson, S.M., Lofgreen, D.F., Rhiger, D.

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Microstructural Characterization of CdTe(211)B/ZnTe/Si(211) Heterostructures Grown by Molecular Beam Epitaxy von ZHAO, W. F., JACOBS, R. N., JAIME-VASQUEZ, M., BUBULAC, L. O., SMITH, DAVID J.

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Dislocation Analysis in (112)B HgCdTe/CdTe/Si von Benson, J. D., Farrell, S., Brill, G., Chen, Y., Wijewarnasuriya, P. S., Bubulac, L. O., Smith, P. J., Jacobs, R. N., Markunas, J. K., Jaime-Vasquez, M., Almeida, L. A., Stoltz, A., Lee, U., Vilela, M. F., Peterson, J., Johnson, S. M., Lofgreen, D. D., Rhiger, D., Patten, E. A., Goetz, P. M.

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Characterization of Dislocations in (112)B HgCdTe/CdTe/Si von Benson, J. D., Bubulac, L. O., Smith, P. J., Jacobs, R. N., Markunas, J. K., Jaime-Vasquez, M., Almeida, L. A., Stoltz, A. J., Wijewarnasuriya, P. S., Brill, G., Chen, Y., Lee, U., Vilela, M. F., Peterson, J., Johnson, S. M., Lofgreen, D. D., Rhiger, D., Patten, E. A., Goetz, P. M.

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Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrates von Benson, J. D., Bubulac, L. O., Lennon, C. M., Jacobs, R. N., Smith, P. J., Markunas, J. K., Jaime-Vasquez, M., Almeida, L. A., Stoltz, A., Arias, J. A., Brill, G., Chen, Y., Wijewarnasuriya, P. S., Vilela, M. F., Peterson, J., Johnson, S. M., Lofgreen, D. D., Rhiger, D., Patten, E. A., Bangs, J.

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Evaluation of Surface Cleaning of Si(211) for Molecular-Beam Epitaxy Deposition of Infrared Detectors von Jaime-Vasquez, M., Jacobs, R. N., Benson, J. D., Stoltz, A. J., Almeida, L. A., Bubulac, L. O., Chen, Y., Brill, G.

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Topography and Dislocations in (112)B HgCdTe/CdTe/Si von Benson, J. D., Smith, P. J., Jacobs, R. N., Markunas, J. K., Jaime-Vasquez, M., Almeida, L. A., Stoltz, A., Bubulac, L. O., Groenert, M., Wijewarnasuriya, P. S., Brill, G., Chen, Y., Lee, U.

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Wafer Mapping Using Deuterium Enhanced Defect Characterization von Hossain, K., Holland, O.W., Hellmer, R., VanMil, B., Bubulac, L.O., Golding, T.D.

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Growth and Analysis of HgCdTe on Alternate Substrates von Benson, J.D., Bubulac, L.O., Smith, P.J., Jacobs, R.N., Markunas, J.K., Jaime-Vasquez, M., Almeida, L.A., Stoltz, A., Arias, J.M., Brill, G., Chen, Y., Wijewarnasuriya, P.S., Farrell, S., Lee, U.

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Defects and the Formation of Impurity ‘Hot Spots’ in HgCdTe/CdZnTe von Benson, J. D., Bubulac, L. O., Jacobs, R. N., Wang, A., Arias, J. M., Almeida, L. A., Stoltz, A., Reddy, M., Peterson, J. M., Johnson, S. M., Bangs, J. W., Lofgreen, D. D.

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Novel very sensitive analytical technique for compositional analysis of Hg1-xCdxTe epilayers von BUBULAC, L. O, VISWANATHAN, C. R

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Impurity ‘Hot Spots’ in MBE HgCdTe/CdZnTe von Benson, J. D., Bubulac, L. O., Wang, A., Jacobs, R. N., Arias, J. M., Jaime-Vasquez, M., Smith, P. J., Almeida, L. A., Stoltz, A., Wijewarnasuriya, P. S., Yulius, A., Carmody, M., Reddy, M., Peterson, J., Johnson, S. M., Bangs, J., Lofgreen, D. D.

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Impact of CdZnTe Substrates on MBE HgCdTe Deposition von Benson, J. D., Bubulac, L. O., Jaime-Vasquez, M., Arias, J. M., Smith, P. J., Jacobs, R. N., Markunas, J. K., Almeida, L. A., Stoltz, A., Wijewarnasuriya, P. S., Peterson, J., Reddy, M., Jones, K., Johnson, S. M., Lofgreen, D. D.

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Analysis of Etched CdZnTe Substrates von Benson, J. D., Bubulac, L. O., Jaime-Vasquez, M., Lennon, C. M., Arias, J. M., Smith, P. J., Jacobs, R. N., Markunas, J. K., Almeida, L. A., Stoltz, A., Wijewarnasuriya, P. S., Peterson, J., Reddy, M., Jones, K., Johnson, S. M., Lofgreen, D. D.

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As-Received CdZnTe Substrate Contamination von Benson, J. D., Bubulac, L. O., Jaime-Vasquez, M., Lennon, C. M., Smith, P. J., Jacobs, R. N., Markunas, J. K., Almeida, L. A., Stoltz, A., Arias, J. M., Wijewarnasuriya, P. S., Peterson, J., Reddy, M., Vilela, M. F., Johnson, S. M., Lofgreen, D. D., Yulius, A., Carmody, M., Hirsch, R., Fiala, J., Motakef, S.

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Planar p-on-n HgCdTe heterostructure photovoltaic detectors von ARIAS, J. M, PASKO, J. G, ZANDIAN, M, SHIN, S. H, WILLIAMS, G. M, BUBULAC, L. O, DEWAMES, R. E, TENNANT, W. E

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As diffusion in Hg1-xCdxTe for junction formation von Bubulac, L O, Irvine, S J C, Gertner, E R, Bajaj, J, Lin, W P, Zucca, R

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P-on-n arsenic-activated junctions in MOCVD LWIR HgCdTe/GaAs von Bubulac, L O, Edwall, D D, McConnell, D, DeWames, R E, Blazejewski, E R, Gertner, E R

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Characteristics and uniformity of group V implanted and annealed HgCdTe heterostructure von Bubulac, L O, Bajaj, J, Tennant, W E, Zandian, M

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