Infra-red reflectivity of ion-implanted and pulsed excimer laser irradiated 4H-SiC von KEY, P. H, SANDS, D, SCHLAF, M, WALTON, C. D, ANTHONY, C. J, BRUNSON, K. M, UREN, M. J

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Polysilicon process development for fully integrated surface-micromachined accelerometer with CMOS electronics von KING, D. O, WARD, M. C. L, BRUNSON, K. M, HAMILTON, D. J

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Separation of two distinct fast interface state contributions at the (100)Si/SiO2 interface using the conductance technique von UREN, M. J, BRUNSON, K. M, HODGE, A. M

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An improved technique for the evaluation of surface Fermi energy in metal-oxide-semiconductor capacitors von Uren, M J, Brunson, K M

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Interface state capture cross section measurements on vacuum annealed and radiation damaged Si:SiO2 surfaces von UREN, M. J, NAYAR, V, BRUNSON, K. M, ANTHONY, C. J, STATHIS, J. H, CARTIER, E

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Measured intrinsic defect density throughout the entire band gap at the Si/SiO2 interface von Sands, D, Brunson, K M, Tayarani-Najaran, M H

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Positron annihilation spectroscopy of laser-irradiated 4H-SiC von Coleman, P.G, Malik, F, Uren, M.J, Brunson, K.M, Sands, D, Walton, C.D

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Rapid analysis of conductance data in metal-oxide-semiconductor measurements using an approximate method von Sands, D., Brunson, K.M.

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Biocidal activity of hydantoin-containing polyurethane polymeric surface modifiers von Grunzinger, Stephen J., Kurt, Pinar, Brunson, Kennard M., Wood, Lynn, Ohman, Dennis E., Wynne, Kenneth J.

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The relative contributions of recombination and tunnelling at interface states to the a.c. conductance of metal-insulator-semiconductor diodes von Sands, D., Brunson, K.M., Thomas, C.B.

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Effect of deposition process on the thin-film ZnS/p-Si interface von SANDS, D, BRUNSON, K. M, THOMAS, C. B, REEHAL, H. S

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The contribution of bulk states to the ac conductance of metal-insulator-semiconductor diodes von BRUNSON, K. M, SANDS, D, THOMAS, C. B, REEHAL, H. S

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Influence of the deposition temperature on the photoluminescence from thin film ZnS:Mn von THOMAS, C. B, SANDS, D, BRUNSON, K. M, REEHAL, H. S

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Characterization of layout dependent thermal coupling in SOI CMOS current mirrors von Tenbroek, B.M., Redman-White, W., Lee, M.S.L., Bunyan, R.J.T., Uren, M.J., Brunson, K.M.

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Heterojunctions of radio-frequency-sputtered thin films of ZnS and p-Si von Sands, D, Brunson, K M, Reehal, H S, Thomas, C B

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A modified charge-voltage technique for interface-state measurements in metal-oxide-semiconductor capacitors von Sands, D, Brunson, K M, Thomas, C B

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ZnS1-xOx:Mn and ZnS1-xSex:Mn as thin-film electroluminescent materials von Sands, D, Brunson, K M, Cheung, C C, Thomas, C B

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Composition and structure of semi-insulating polycrystalline silicon thin films von Brunson, Kevin M., Sands, David, Thomas, Clive B., Jeynes, Chris, Watts, John F.

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Versatile high voltage level shift and driver for MEMS applications von Saul, P H, Brunson, K M, Bunyan, R J T

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GLC Determination of Ethinamate and Its Hydroxy Derivative in Biological Fluids von Kleber, J.W., Bechtol, L.D., Brunson, M.K., Chernish, S.M.

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