Instrumentation de stations de mesure en continu des flux de sédiments en suspension à l’usine de la Coche dans les alpes Francaises (Savoie) von Ortiz, Olivier, Lauters, François, Brunet, Laurent, Couzon, Pierre-Yves

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Integration of Low Temperature SiGe:B Raised Sources and Drains in p-Type FDSOI Field Effect Transistors von Lu, Cao-Minh Vincent, Fenouillet-Beranger, Claire, Hartmann, Jean-Michel, Rodriguez, Philippe, Benevent, Véronique, Samson, Marie-Pierre, Previtali, Bernard, Tabone, Claude, Cassé, Mikael, Allain, Fabienne, Romano, Giovanni, Brunet, Laurent, Batude, Perrine, Skotnicki, Thomas, Vinet, Maud

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Variance Analysis in 3-D Integration: A Statistically Unified Model With Distance Correlations von Ayres, Alexandre, Rozeau, Olivier, Borot, Bertrand, Fesquet, Laurent, Batude, Perrine, Brunet, Laurent, Vinet, Maud

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Variance Analysis in 3D Integration: A statistically Unified Model with Distance Correlations von Ayres de Sousa, Alexandre, Rozeau, Olivier, Borot, Bertrand, Fesquet, Laurent, Batude, Perrine, Brunet, Laurent, Vinet, Maud

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Total-Ionizing-Dose Effects on 3D Sequentially-Integrated FDSOI Ring Oscillators von Toguchi, Shintaro, Zhang, En Xia, Fleetwood, Daniel M., Schrimpf, Ronald D., Moreau, Stephane, Batude, Perrine, Brunet, Laurent, Andrieu, Francois, Alles, Michael L.

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Selective Epitaxial Growth of SiGe(:B) for Advanced p-Type Fd-SOI von Lespiaux, Justine, Kanyandekwe, Joël, Marion, Tanguy, Saidi, Lazhar, Lapras, Valérie, Bond, Alice, Bringuier, Fabien, Richy, Jérôme, Thouvard, Alan, Biet, Tim, Nolot, Emmanuel, Couture, Ludovic, Brunet, Laurent, Rodriguez, Philippe, Dos Reis, Eva, Gauthier, Nicolas, Blot-Saby, Adrien, Hartmann, Jean-Michel

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Total-Ionizing-Dose Effects on 3-D Sequentially Integrated FDSOI Ring Oscillators von Toguchi, Shintaro, Zhang, En Xia, Fleetwood, Daniel M., Schrimpf, Ronald D., Moreau, Stephane, Batude, Perrine, Brunet, Laurent, Andrieu, Francois, Alles, Michael L.

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Total-Ionizing-Dose Effects on 3D Sequentially Integrated, Fully Depleted Silicon-on-Insulator MOSFETs von Toguchi, Shintaro, Zhang, En Xia, Gorchichko, Mariia, Fleetwood, Daniel M., Schrimpf, Ronald D., Reed, Robert A., Moreau, Stephane, Cheramy, Severine, Batude, Perrine, Brunet, Laurent, Andrieu, Francois, Alles, Michael L.

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Effects of Layer-to-Layer Coupling on the Total-Ionizing-Dose Response of 3-D-Sequentially Integrated FD-SOI MOSFETs von Toguchi, Shintaro, Zhang, En Xia, Rony, Mohammed W., Luo, Xuyi, Fleetwood, Daniel M., Schrimpf, Ronald D., Moreau, Stephane, Cheramy, Severine, Batude, Perrine, Brunet, Laurent, Andrieu, Francois, Alles, Michael L.

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Charge Trapping and Transconductance Degradation in Irradiated 3-D Sequentially Integrated FDSOI MOSFETs von Toguchi, Shintaro, Zhang, En Xia, Fleetwood, Daniel M., Schrimpf, Ronald D., Reed, Robert A., Moreau, Stephane, Cheramy, Severine, Batude, Perrine, Brunet, Laurent, Andrieu, Francois, Alles, Michael L.

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Very Low Temperature Tensile and Selective Si:P Epitaxy for Advanced CMOS Devices von Kanyandekwe, Joël, Bauer, Matthias, Marion, Tanguy, Saidi, Lazhar, Pin, Jean-Baptiste, Bisserier, Jeremie, Richy, Jérôme, Gauthier, Nicolas, Dezest, Pattamon, Brunet, Laurent, Lapras, Valérie, Dewolf, Tristan, Thomas, Shawn, Hartmann, Jean-Michel

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Ultraviolet Nanosecond Laser Annealing for Low Temperature 3D-Sequential Integration Gate Stack von Kerdilès, Sébastien, Acosta-Alba, Pablo, Royet, Anne-Sophie, Lassarre, Jessica, Perrot, Cédric, Aussenac, François, Brunet, Laurent, Fenouillet-Beranger, Claire

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(Invited) 3D Monolithic Integration von Brunet, Laurent, Batude, Perrine, Fenouillet-Beranger, Claire, Vinet, Maud

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(Keynote) Low Temperature SmartCutTM Process for 3D Integration von Schwarzenbach, Walter, Reboh, Shay, Ghorbel, Aymen, Gaudin, Gweltaz, Besnard, Guillaume, Mazen, Frédéric, Loup, Virginie, Maitrejean, Sylvain, Brunet, Laurent, Nguyen, Bich-Yen, Maleville, Christophe

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(Keynote) Low Temperature SmartCut TM Process for 3D Integration von Schwarzenbach, Walter, Reboh, Shay, Ghorbel, Aymen, Gaudin, Gweltaz, Besnard, Guillaume, Mazen, Frédéric, Loup, Virginie, Maitrejean, Sylvain, Brunet, Laurent, Nguyen, Bich-Yen, Maleville, Christophe

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Taking the steps toward sustainable livestock: our multidisciplinary global farm platform journey von Rivero, M Jordana, Evans, Alex C O, Berndt, Alexandre, Cartmill, Andrew, Dowsey, Andrew, Farruggia, Anne, Mignolet, Catherine, Enriquez-Hidalgo, Daniel, Chadwick, Dave, McCracken, Davy I, Busch, Dennis, Pereyra, Fabiana, Martin, Graeme B, Sanford, Gregg R, Sheridan, Helen, Wright, Iain, Brunet, Laurent, Eisler, Mark C, Lopez-Villalobos, Nicolas, Rovira, Pablo, Harris, Paul, Murphy, Paul, Williams, A Prysor, Jackson, Randall D, Machado, Rui, P T, Suraj, Puech, Thomas, Boland, Tommy M, Ayala, Walter, Lee, Michael R F

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(Invited) Sequential 3D Process Integration: Opportunities for Low Temperature Processing von Kerdilès, Sébastien, Acosta-Alba, Pablo, Mathieu, Benoit, Veillerot, Marc, Denis, Hervé, Aussenac, François, Mazzamuto, Fulvio, Toque-Tresonne, Inès, Huet, Karim, Samson, Marie-Pierre, Previtali, Bernard, Brunet, Laurent, Batude, Perrine, Fenouillet-Beranger, Claire

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(Invited) Direct Bonding: A Key Enabler for 3D Monolithic Integration von Brunet, Laurent, Batude, Perrine, Fournel, Frank, Benaissa, Lamine, Fenouillet-Beranger, Claire, Pasini, Luca, Deprat, Fabien, Previtali, Bernard, Ponthenier, Fabienne, Seignard, Aurélien, Euvrard-Colnat, Catherine, Rivoire, Maurice, Besson, Pascal, Arvet, Christian, Beche, Elodie, Rozeau, Olivier, Billoint, Olivier, Turkyilmaz, Ogun, Clermidy, Fabien, Signamarcheix, Thomas, Vinet, Maud

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Impact of the Metal Gate on Carrier Transport in HK/MG Transistors von Cassé, Mikaël, Garros, Xavier, Brunet, Laurent, Reimbold, Gilles

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Process for fabricating a transistor structure including a plugging step von Brunet, Laurent, Posseme, Nicolas

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