EDMR and EPR Studies of 4H SiC MOSFETs and Capacitors von Lenahan, Patrick M., Cochrane, Corey J., Lelis, Aivars J., Matocha, Kevin, Bittel, Brad C., Fronheiser, Jody

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Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability von Mutch, Michael J., Pomorski, Thomas, Bittel, Brad C., Cochrane, Corey J., Lenahan, Patrick M., Liu, Xin, Nemanich, Robert J., Brockman, Justin, French, Marc, Kuhn, Markus, French, Benjamin, King, Sean W.

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Color center formation in vacuum sintered Nd3xY3−3xAl5O12 transparent ceramics von Stevenson, Adam J., Bittel, Brad C., Leh, Christopher G., Li, Xin, Dickey, Elizabeth C., Lenahan, Patrick M., Messing, Gary L.

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Color center formation in vacuum sintered Nd 3 x Y 3 − 3 x Al 5 O 12 transparent ceramics von Stevenson, Adam J., Bittel, Brad C., Leh, Christopher G., Li, Xin, Dickey, Elizabeth C., Lenahan, Patrick M., Messing, Gary L.

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An Electron Paramagnetic Resonance Study of Defects in Interlayer Dielectrics von Bittel, Brad C., Pomorski, Thomas, Lenahan, Patrick M., King, Sean

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Methods and apparatus to reduce thermal fluctuations in semiconductor processors von De Oliveira Vivi, Rodrigo, Kelbert, John, Moret, Eric, Bittel, Brad, Kandula, Phani Kumar, Lombard, David, Luckeroth, Mark

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SYSTEMS AND METHODS FOR STABLE AND ELEVATED IDLE-MODE TEMPERATURE FOR ASSEMBLED SEMICONDUCTOR DEVICES von LUCKEROTH, Mark J, KABURLASOS, Nikos, KANDULA, Phani Kumar, MORET, Eric J.M, KELBERT, John, LOMBARD, David N, BEUCHAT, Marc, VIVI, Rodrigo, BITTEL, Brad

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METHODS AND APPARATUS TO REDUCE THERMAL FLUCTUATIONS IN SEMICONDUCTOR PROCESSORS von MORET, Eric, KANDULA, Phani Kumar, KELBERT, John, LUCKEROTH, Mark, DE OLIVEIRA VIVI, Rodrigo, BITTEL, Brad, LOMBARD, David

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SYSTEMS AND METHODS FOR STABLE AND ELEVATED IDLE-MODE TEMPERATURE FOR ASSEMBLED SEMICONDUCTOR DEVICES von LUCKEROTH, Mark J, KABURLASOS, Nikos, KANDULA, Phani Kumar, MORET, Eric J.M, KELBERT, John, LOMBARD, David N, DE OLIVEIRA VIVI, Rodrigo, BEUCHAT, Marc, BITTEL, Brad

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SYSTEMS AND METHODS FOR STABLE AND ELEVATED IDLE-MODE TEMPERATURE FOR ASSEMBLED SEMICONDUCTOR DEVICES von De Oliveira Vivi, Rodrigo, Kelbert, John, Kaburlasos, Nikos, Kandula, Phani Kumar, Beuchat, Marc, Bittel, Brad, Moret, Eric J.M, Lombard, David N, Luckeroth, Mark J

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METHODS AND APPARATUS TO REDUCE THERMAL FLUCTUATIONS IN SEMICONDUCTOR PROCESSORS von De Oliveira Vivi, Rodrigo, Kelbert, John, Moret, Eric, Bittel, Brad, Kandula, Phani Kumar, Lombard, David, Luckeroth, Mark

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Defects in Low-κ Dielectrics and Etch Stop Layers for Use as Interlayer Dielectrics von Bittel, Brad C., Lenahan, Patrick M., Pomorski, Thomas, King, Sean

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METHOD AND DEVICE FOR REDUCING HEAT FLUCTUATION IN SEMICONDUCTOR PROCESSOR von JOHN KELBERT, BRAD BITTEL, PHANI KUMAR KANDULA, RODRIGO DE OLIVEIRA VIVI, ERIC MORET, MARK LUCKEROTH, DAVID LOMBARD

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Spin dependent charge pumping: A new tool for MOS interface characterization von Bittel, B. C., Lenahan, P. M., Ryan, J. T., Fronheiser, J., Lelis, A. J.

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SYSTEM AND METHOD FOR REDUCED CACHE MODE von ROBERTSON JAMES PATRICK, MUTHLER GREGORY ALAN, LEW STEPHEN D, SIMERAL BRAD W, BITTEL DON, WOODMANSEE MICHAEL A, BURGESS JOHN MATTHEW, RUBINSTEIN OREN, RIEGELSBERGER EDWARD

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