Local environment of metal ions in phthalocyanines: K-edge X-ray absorption spectra von Rossi, G, d'Acapito, F, Amidani, L, Boscherini, F, Pedio, M

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Structure of Ultrathin CeO2 Films on Pt(111) by Polarization-Dependent X‑ray Absorption Fine Structure von Luches, P, Pagliuca, F, Valeri, S, Boscherini, F

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The effect of long-range order on intermolecular interactions in organic semiconductors: zinc octaethyl porphyrin molecular thin film model systems von Kumar, A, Naumenko, D, Rossi, G, Magnano, E, Nappini, S, Bondino, F, Segoloni, E, Amidani, L, d'Acapito, F, Boscherini, F, Barba, L, Pace, E, Benfatto, M, Casassa, S, Pedio, M

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Appearance potential spectroscopy with a photon counting detector and multiple scattering spectral interpretation von Amidani, L, Pasquini, L, Boscherini, F

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Atomic and electronic structure of ultrathin fluoride barrier layers at the oxide/Si interface von PASQUALI, L, MONTECCHI, M, NANNARONE, S, BOSCHERINI, F

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Depth-dependent magnetization reversal and spin structure of Fe/NiO exchange-coupled epitaxial bilayers von Luches, P., Pasquini, L., Benedetti, S., Valeri, S., Rüffer, R., Boscherini, F.

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Connections between local and macroscopic properties in solids: The case of N in III-V-N alloys von Amidani, L., Ciatto, G., Boscherini, F., Filippone, F., Mattioli, G., Alippi, P., Bondino, F., Polimeni, A., Capizzi, M., Amore Bonapasta, A.

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X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2−xO3 (x = 0–2) films on Si (111) von Niu, G., Zoellner, M. H., Zaumseil, P., Pouliopoulos, A., d'Acapito, F., Schroeder, T., Boscherini, F.

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The Mn site in Mn-doped GaAs nanowires: an EXAFS study von d'Acapito, F, Rovezzi, M, Boscherini, F, Jabeen, F, Bais, G, Piccin, M, Rubini, S, Martelli, F

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Growth of NiO on Ag(001):  Atomic Environment, Strain, and Interface Relaxations Studied by Polarization Dependent Extended X-ray Absorption Fine Structure von Groppo, E, Prestipino, C, Lamberti, C, Luches, P, Giovanardi, C, Boscherini, F

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Iron oxidation, interfacial expansion, and buckling at the Fe/NiO(001) interface von Luches, P, Bellini, V, Colonna, S, Di Giustino, L, Manghi, F, Valeri, S, Boscherini, F

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X-ray absorption studies of atomic environments in semiconductor nanostructures von Boscherini, F.

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Local structure of nitrogen-hydrogen complexes in dilute nitrides von Ciatto, G., Boscherini, F., Amore Bonapasta, A., Filippone, F., Polimeni, A., Capizzi, M., Berti, M., Bisognin, G., De Salvador, D., Floreano, L., Martelli, F., Rubini, S., Grenouillet, L.

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Absence of oxide formation at the Fe/MgO(0 0 1) interface von Luches, P., Benedetti, S., Liberati, M., Boscherini, F., Pronin, I.I., Valeri, S.

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X-ray absorption fine structure study of In implanted GaN: Effect of annealing von Katsikini, M., Pinakidou, F., Paloura, E.C., Boscherini, F., Wendler, E., Wesch, W.

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Evolution of the intermixing process in Ge/Si(111) self-assembled islands von Motta, N, Rosei, F, Sgarlata, A, Capellini, G, Mobilio, S, Boscherini, F

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NiO and MgO ultrathin films by polarization dependent XAS von Luches, P., Groppo, E., D'Addato, S., Lamberti, C., Prestipino, C., Valeri, S., Boscherini, F.

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Soft X-ray XANES of N in ZnO:N – Why is doping so difficult? von Fons, P., Tampo, H., Niki, S., Kolobov, A.V., Ohkubo, M., Tominaga, J., Friedrich, S., Carboni, R., Boscherini, F.

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Local structure of Fe incorporated in GaInP layers by high temperature ion implantation von Cesca, T., Gasparotto, A., Mattei, G., Fraboni, B., Boscherini, F., Longo, M., Tarricone, L.

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X-ray absorption and diffraction study of II–VI dilute oxide semiconductor alloy epilayers von Boscherini, F, Malvestuto, M, Ciatto, G, D’Acapito, F, Bisognin, G, De Salvador, D, Berti, M, Felici, M, Polimeni, A, Nabetani, Y

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