Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination von Bortchagovsky, E. G.

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Ellipsometry of monolayers of metallic nanoparticles taking into account depolarization von Bortchagovsky, E.G., Mishakova, T.O., Hingerl, K.

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Structural insight into nanoscale inhomogeneity of electrical properties in highly conductive polycrystalline ZnO thin films doped using methane von Vasin, A V, Gomeniuk, Y V, Lytvyn, P M, Rusavsky, A V, Mamykin, S V, Tyagulsky, I P, Bortchagovsky, E, Havryliuk, Ye, Tiagulskyi, S I, Yatskiv, R, Grym, J, Zahn, D R T, Nazarov, A N

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Plasmonic Properties of Thin Annealed Gold Films von Bortchagovsky, E., Mishakova, T., Styopkin, V.

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Microellipsometry study of plasmonic properties of metal–insulator–metal structures with ordered lattices of nanoparticles von Bortchagovsky, E., Demydenko, Yu, Bogoslovskaya, A., Tang, J., Dai, F., Fleischer, M., Milekhin, I., Sharma, A., Salvan, G., Zahn, D. R. T.

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Erratum: “Microellipsometry study of plasmonic properties of metal-insulator-metal structures with ordered lattices of nanoparticles” [J. Appl. Phys. 129, 123104 (2021)] von Bortchagovsky, E., Demydenko, Yu, Bogoslovskaya, A., Tang, J., Dai, F., Fleischer, M., Milekhin, I., Sharma, A., Salvan, G., Zahn, D. R. T.

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Deficiency of Standard Effective-Medium Approximation for Ellipsometry of Layers of Nanoparticles von Lozovski, V. Z., Jastrabik, L., Dejneka, A., Bortchagovsky, E. G., Mishakova, T. O.

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Some artefacts of the approaches with the discretization in near-field optics calculations von BORTCHAGOVSKY, E.G

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Reflection polarized light microscopy and its application to pyrolytic carbon deposits von Bortchagovsky, E. G.

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improved method for angular-resolved characterization of the optical anisotropy of pyrolytic carbon von REZNIK, B, GERTHSEN, D, BORTCHAGOVSKY, E

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Internal standard for tip-enhanced Raman spectroscopy von Bortchagovsky, E., Schmid, T., Zenobi, R.

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Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering von Vasin, A.V., Rusavsky, A.V., Bortchagovsky, E.G., Gomeniuk, Y.V., Nikolenko, A.S., Strelchuk, V.V., Yatskiv, R., Tiagulskyi, S., Prucnal, S., Skorupa, W., Nazarov, A.N.

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Simple modeling of the ratio of fields at a tip and at contacting surface von Bortchagovsky, E. G.

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The shape of transmission spectra of thin films deposited on a substrate von Bortchagovsky, E G, Fischer, U C, Fuchs, H

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Transmission of an obliquely incident beam of light through small apertures in a metal film von Bortchagovsky, E., Colas des Francs, G., Molenda, D., Naber, A., Fischer, U.C.

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On the optimum form of an aperture for a confinement of the optically excited electric near field von BORTCHAGOVSKY, E, COLAS DES FRANCS, G, NABER, A, FISCHER, U.C

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Optical properties of pyrolytic carbon deposits deduced from measurements of the extinction angle by polarized light microscopy von Bortchagovsky, E.G., Reznik, B., Gerthsen, D., Pfrang, A., Schimmel, Th

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On the modulation of optical transmission spectra of thin dye layers by a supporting medium von Bortchagovsky, E. G., Fischer, U. C.

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Ellipsometric method for investigation of the optical anisotropy of thin films: theory and calculations von Bortchagovsky, E.G.

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Luminescent analysis of the quality of CdS nanocrystals depending on technological parameters von Bogoslovskaya, A.B.

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