Correlative analysis of embedded silicon interface passivation by Kelvin probe force microscopy and corona oxide characterization of semiconductor von Aubriet, Valentin, Courouble, Kristell, Gros-Jean, Mickael, Borowik, Łukasz

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Micro LED performance - a cathodoluminescence study von Rochat, Névine, González-Izquierdo, Palmerina, Zoccarato, Davide, Rol, Fabian, Simon, Julia, Le Maitre, Patrick, Volpert, Marion, Charles, Matthew, Lafossas, Matthieu, Torrengo, Simona, Bonnet, Noemie, Coenen, Toon, Borowik, Lukasz

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Hidden surface photovoltages revealed by pump probe KPFM von Aubriet, Valentin, Courouble, Kristell, Bardagot, Olivier, Demadrille, Renaud, Borowik, Łukasz, Grévin, Benjamin

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Calibrated work function mapping by Kelvin probe force microscopy von Fernández Garrillo, Pablo A., Grévin, Benjamin, Chevalier, Nicolas, Borowik, Łukasz

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Selective area growth of AlGaN nanopyramids by conventional and pulsed MOVPE von Boughaleb, Sofia, Martin, Brigitte, Matei, Constantin, Templier, Roselyne, Borowik, Łukasz, Rochat, Nevine, Gil, Bernard, Dussaigne, Amélie

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Kelvin Probe Force Microscopy under Variable Illumination: A Novel Technique To Unveil Charge Carrier Dynamics in GaN von González-Izquierdo, Palmerina, Rochat, Névine, Charles, Matthew, Sochacki, Tomasz, Borowik, Łukasz

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On method of estimating recombination rates by analysis of time-resolved luminescence von Sakowski, Konrad, Borowik, Łukasz, Rochat, Névine, Kempisty, Pawel, Strak, Pawel, Majewska, Natalia, Mahlik, Sebastian, Koroński, Kamil, Sochacki, Tomasz, Piechota, Jacek, Fouchier, Marc, Kaminska, Agata, Krukowski, Stanislaw

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How to control solid state dewetting: A short review von Leroy, F., Borowik, Ł., Cheynis, F., Almadori, Y., Curiotto, S., Trautmann, M., Barbé, J.C., Müller, P.

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Photo-Carrier Multi-Dynamical Imaging at the Nanometer Scale in Organic and Inorganic Solar Cells von Fernández Garrillo, Pablo A, Borowik, Łukasz, Caffy, Florent, Demadrille, Renaud, Grévin, Benjamin

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GaN/InGaN LED Sidewall Defects Analysis by Cathodoluminescence and Photosensitive Kelvin Probe Force Microscopy von González-Izquierdo, Palmerina, Rochat, Névine, Sakowski, Konrad, Zoccarato, Davide, Charles, Matthew, Borowik, Łukasz

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Influence of Shape and Size on GaN/InGaN μLED Light Emission: A Competition between Sidewall Defects and Light Extraction Efficiency von González-Izquierdo, Palmerina, Rochat, Névine, Zoccarato, Davide, Rol, Fabian, Simon, Julia, Le Maitre, Patrick, Volpert, Marion, Charles, Matthew, Lafossas, Matthieu, Torrengo, Simona, Borowik, Łukasz

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200 mm-scale growth of 2D layered GaSe with preferential orientation von Martin, Mickaël, Pochet, Pascal, Okuno, Hanako, Alvarez, Carlos, Bellet-Amalric, Edith, Hauchecorne, Pauline, Levert, Théo, Pelissier, Bernard, Borowik, Łukasz, Bassani, Franck, David, Sylvain, Moeyaert, Jeremy, Baron, Thierry

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Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation von Fernández Garrillo, Pablo, Grevin, Benjamin, Borowik, Łukasz

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A scanning probe microscopy study of nanostructured TiO2/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications von Letertre Laurie, Roche, Roland, Douhéret Olivier, Kassa, Hailu G, Mariolle Denis, Chevalier, Nicolas, Borowik Łukasz, Dumas, Philippe, Grévin Benjamin, Lazzaroni, Roberto, Leclère Philippe

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Calculating Kelvin force microscopy signals from static force fields von Borowik, Łukasz, Kusiaku, Koku, Théron, Didier, Mélin, Thierry

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Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X‑ray Photoelectron Emission Microscopy von Pouch, Sylvain, Amato, Michele, Bertocchi, Matteo, Ossicini, Stefano, Chevalier, Nicolas, Mélin, Thierry, Hartmann, Jean-Michel, Renault, Olivier, Delaye, Vincent, Mariolle, Denis, Borowik, Łukasz

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Environment and baking influence on charge retention on silicon nitride charge trap layers von Sridhara, Karthik, Borowik, Łukasz, Mariolle, Denis, Chevalier, Nicolas, Colonna, Jean-Philippe

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The influence of strain on dewetting of silicon films von Borowik, Łukasz, Chevalier, Nicolas, Mariolle, Denis, Bertin, François, Chabli, Amal, Barbé, Jean-Charles

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Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy von Palleau, E, Ressier, L, Borowik, Ł, Mélin, T

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Controlled synthesis of SiC nanoparticles from surface silicon contamination von Borowik, Łukasz, Chevalier, Nicolas, Mariolle, Denis, Martinez, Eugénie, Bertin, François, Chabli, Amal, Barbé, Jean-Charles

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