Machine Learning in VLSI Computer-Aided Design von Elfadel, Ibrahim (Abe) M, Boning, Duane S, Li, Xin

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Modern Trends in Microelectronics Packaging Reliability Testing von Bender, Emmanuel, Bernstein, Joseph B, Boning, Duane S

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Modeling Spin Coating Over Topography and Uniformity Improvements Through Fill Patterns for Advanced Packaging Technologies von Lang, Christopher I., Boning, Duane S.

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Few-Shot Bayesian Performance Modeling for Silicon Photonic Devices Under Process Variation von Gao, Zhengqi, Zhang, Zhengxing, Boning, Duane S.

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Automatic Synthesis of Broadband Silicon Photonic Devices via Bayesian Optimization von Gao, Zhengqi, Zhang, Zhengxing, Boning, Duane S.

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Impact of process variations on splitter-tree-based integrated optical phased arrays von Zhang, Zhengxing, Notaros, Milica, Gao, Zhengqi, Chakraborty, Uttara, Notaros, Jelena, Boning, Duane S

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Selecting robust silicon photonic designs after Bayesian optimization without extra simulations von Gao, Zhengqi, Zhang, Zhengxing, He, ZiChang, Gu, Jiaqi, Pan, David Z, Boning, Duane S

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Provable Routing Analysis of Programmable Photonic Circuits von Gao, Zhengqi, Chen, Xiangfeng, Zhang, Zhengxing, Lai, Chih-Yu, Chakraborty, Uttara, Bogaerts, Wim, Boning, Duane S.

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Variation-Aware Methods and Models for Silicon Photonic Design-for-Manufacturability von Boning, Duane S., El-Henawy, Sally I., Zhang, Zhengxing

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Inference of process variations in silicon photonics from characterization measurements von Zhang, Zhengxing, El-Henawy, Sally I, Ríos Ocampo, Carlos A, Boning, Duane S

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Modeling and Optimizing the Impact of Process and Equipment Parameters in Sputtering Deposition Systems Using a Gaussian Process Machine Learning Framework von Lang, Christopher I., Jansen, Alexander, Didari, Sima, Kothnur, Prashanth, Boning, Duane S.

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Intelligent Optimization of Dosing Uniformity in Ion Implantation Systems von Lang, Christopher I., Sprenkle, Rick, Wilson, Eric, Samolov, Ana, Boning, Duane S.

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Measuring the Absolute Concentration of Microparticles in Suspension Using High-Frequency B-Mode Ultrasound Imaging von Lee, John H., Boning, Duane S., Anthony, Brian W.

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Understanding and Improving Virtual Metrology Systems Using Bayesian Methods von Lang, Christopher I., Sun, Fan-Keng, Veerasingam, Ramana, Yamartino, John, Boning, Duane S.

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Enabling Wavelength-Dependent Adjoint-Based Methods for Process Variation Sensitivity Analysis in Silicon Photonics von Zhang, Zhengxing, El-Henawy, Sally I., Sadun, Allan, Miller, Ryan, Daniel, Luca, White, Jacob K., Boning, Duane S.

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Mitigation of Thermal Stability Concerns in FinFET Devices von Bender, Emmanuel, Bernstein, Joseph B., Boning, Duane S.

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Modeling and Controlling Layout Dependent Variations in Semi-Additive Copper Electrochemical Plating von Lang, Christopher I., Boning, Duane S.

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A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers von Boo, Hyun H., Boning, Duane S., Hae-Seung Lee

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One Class Process Anomaly Detection Using Kernel Density Estimation Methods von Lang, Christopher I., Sun, Fan-Keng, Lawler, Bruce, Dillon, Jack, Dujaili, Ash Al, Ruth, John, Cardillo, Peter, Alfred, Perry, Bowers, Alan, Mckiernan, Adrian, Boning, Duane S.

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Three-dimensional profile stitching based on the fiducial markers for microfluidic devices von Xu, Zhiguang, Li, Shiguang, Burns, Daniel J., Shilpiekandula, Vijay, Taylor, Hayden K., Yoon, Soon Fatt, Youcef-Toumi, Kamal, Reading, Ivan, Fang, Zhongping, Zhao, Jianhong, Boning, Duane S.

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