Diffusion, segregation and solid-state phase transformations: Course reminders and solved problems von Blavette, Didier

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Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe von Di Russo, Enrico, Dalapati, Pradip, Houard, Jonathan, Venturi, Linda, Blum, Ivan, Moldovan, Simona, Le Biavan, Nolwenn, Lefebvre, Denis, Hugues, Maxime, Chauveau, Jean Michel, Blavette, Didier Christian, Deconihout, Bernard, Vella, Angela, Vurpillot, François, Rigutti, Lorenzo

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Boron atomic-scale mapping in advanced microelectronics by atom probe tomography von Estivill, Robert, Juhel, Marc, Servanton, Germain, Gregoire, Magali, Lorut, Fréderic, Clement, Laurent, Chevalier, Pascal, Grenier, Adeline, Blavette, Didier

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A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography von Rolland, Nicolas, Vurpillot, François, Duguay, Sébastien, Blavette, Didier

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Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography von Di Russo, Enrico, Blum, Ivan, Houard, Jonathan, Da Costa, Gérald, Blavette, Didier, Rigutti, Lorenzo

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Atomic scale investigation of arsenic segregation in high-k metal gate stacks von Estivill, Robert, Juhel, Marc, Gregoire, Magali, Grenier, Adeline, Delaye, Vincent, Blavette, Didier

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Atomic scale investigation of Cr precipitation in copper von Chbihi, A., Sauvage, X., Blavette, D.

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Quantitative analysis of Si/SiGeC superlattices using atom probe tomography von Estivill, Robert, Grenier, Adeline, Duguay, Sébastien, Vurpillot, François, Terlier, Tanguy, Barnes, Jean-Paul, Hartmann, Jean-Michel, Blavette, Didier

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3D Atomic Scale Analysis of CMOS type structures for 14 nm UTBB-SOI technology von Estivill, Robert, Grenier, Adeline, Printemps, Tony, Juhel, Marc, Gregoire, Magali, Caubet, Pierre, Blavette, Didier

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Structural Materials: Understanding Atomic-Scale Microstructures von Marquis, Emmanuelle A., Miller, Michael K., Blavette, Didier, Ringer, Simon P., Sudbrack, Chantal K., Smith, George D.W.

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Intragranular nucleation of tetrahedral precipitates and discontinuous precipitation in Cu-5wt%Ag von Bonvalet, M., Sauvage, X., Blavette, D.

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Application of the Tomographic Atom Probe to Selected Problems in Materials Science von Al-Kassab, Talaát, Wollenberger, Heinrich, Blavette, Didier

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Grain size effect on interfacial segregation in nanomaterials von Danoix, F., Hoummada, K., Maugis, P., Rolland, N., Debreux, C., Blavette, D.

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Uphill phosphorus diffusion in carbon co-implanted silicon von Dumas, P., Duguay, S., Hilario, F., Gauthier, A., Blavette, D.

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Optimization of the Magnetic Properties of FePd Alloys by Severe Plastic Deformation von Chbihi, Abdelahad, Sauvage, Xavier, Genevois, Cécile, Blavette, Didier, Gunderov, Dmitry, Popov, Alexander G.

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Atom probe tomography quantification of carbon in silicon von Dumas, P., Duguay, S., Borrel, J., Hilario, F., Blavette, D.

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Suzuki effect on {0 0 1} stacking faults in boron-doped FeAl intermetallics von Cadel, Emmanuel, Fraczkiewicz, Anna, Blavette, Didier

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Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography von Di Russo, E, Blum, I, Rivalta, I, Houard, J, Da Costa, G, Vurpillot, F, Blavette, D, Rigutti, L

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Composition of Carbon Clusters in Implanted Silicon Using Atom Probe Tomography von Dumas, Paul, Duguay, Sebastien, Borrel, Julien, Hilario, Fanny, Blavette, Didier

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Low temperature carbon co-implantation in silicon: Defects suppression and diffusion modeling von Dumas, P., Julliard, P.-L., Borrel, J., Duguay, S., Hilario, F., Deprat, F., Lu, V., Zhao, W., Zou, W, Arevalo, E., Blavette, D.

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