Notulae to the Italian flora of algae, bryophytes, fungi and lichens: 18 von Ravera, Sonia, Vizzini, Alfredo, Puglisi, Marta, Totti, Cecilia, Azzella, Mattia Martin, Battaglini, Andrea, Blaise, Philippe, Boccardo, Fabrizio, Bonini, Ilaria, Cancellieri, Laura, Clerc, Philippe, De Giuseppe, Antonio B., Dovana, Francesco, Fačkovcová, Zuzana, Filibeck, Goffredo, Filippelli, Fabio, Gheza, Gabriele, Hafellner, Josef, Isocrono, Deborah, Laface, Valentina Lucia Astrid, Malíček, Jiří, Mazzacuva, Giuliana, Nascimbene, Juri, Nimis, Pier Luigi, Ongaro, Silvia, Pandeli, Giulio, Paoli, Luca, Passalacqua, Nicodemo G., Puntillo, Domenico, Puntillo, Michele, Rosati, Leonardo, Sicoli, Giovanni, Torino, Luigi, Tretiach, Mauro

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Ab initio calculation of effective work functions for a TiN/HfO2/SiO2/Si transistor stack von Prodhomme, Pierre-Yves, Fontaine-Vive, Fabien, Geest, Abram Van Der, Blaise, Philippe, Even, Jacky

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HfO2-Based RRAM: Electrode Effects, Ti/HfO2 Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and Ab Initio Calculations von Traore, Boubacar, Blaise, Philippe, Vianello, Elisa, Perniola, Luca, De Salvo, Barbara, Nishi, Yoshio

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Exploring charge hopping transport in amorphous HfO$_2$: An approach combing $ab\ initio$ methods and model Hamiltonian von Hirchaou, Youssef, Sklenard, Benoit, Goes, Wolfgang, Blaise, Philippe, Triozon, François, Li, Jing

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Exploring charge hopping transport in amorphous HfO2: An approach combing ab initio methods and model Hamiltonian von Hirchaou, Youssef, Sklénard, Benoît, Goes, Wolfgang, Blaise, Philippe, Triozon, François, Li, Jing

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On the Origin of Low-Resistance State Retention Failure in HfO2-Based RRAM and Impact of Doping/Alloying von Traore, Boubacar, Blaise, Philippe, Vianello, Elisa, Grampeix, Helen, Jeannot, Simon, Perniola, Luca, De Salvo, Barbara, Nishi, Yoshio

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HfO2/Ti Interface Mediated Conductive Filament Formation in RRAM: An Ab Initio Study von Traore, Boubacar, Blaise, Philippe, Sklenard, Benoit, Vianello, Elisa, Magyari-Kope, Blanka, Nishi, Yoshio

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Reduction of Monoclinic HfO 2 : A Cascading Migration of Oxygen and Its Interplay with a High Electric Field von Traoré, Boubacar, Blaise, Philippe, Sklénard, Benoît

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Reduction of Monoclinic HfO2: A Cascading Migration of Oxygen and Its Interplay with a High Electric Field von Traoré, Boubacar, Blaise, Philippe, Sklénard, Benoît

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ELIMINATE CROSSTALK USING SYMMETRY IN MIMO ARRAYS OF INDUCTIVE ANTENNAS: AN INTRODUCTION TO PIE-CHART ANTENNAS von Douarville-Blaise, Jean-Philippe, Pouhe, David, Hirai, Junji

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Prediction of semimetallic tetragonal Hf2O3 and Zr2O3 from first principles von Xue, Kan-Hao, Blaise, Philippe, Fonseca, Leonardo R C, Nishi, Yoshio

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La guerre des voies de communication au Cameroun, 1914-1916 von Essomba, Philippe-Blaise

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Gasification of charcoal derived from tropical wood residues in an updraft fixed bed reactor von Diboma, Benjamin Salomon, Atiotsia, Victor Hugo, Che, Louis Colins, Essomba, Philippe Blaise, Bot, Bill Vaneck, Tamba, Jean Gaston

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HfO 2 /Ti Interface Mediated Conductive Filament Formation in RRAM: An Ab Initio Study von Traore, Boubacar, Blaise, Philippe, Sklenard, Benoit, Vianello, Elisa, Magyari-Kope, Blanka, Nishi, Yoshio

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A Link Between CBRAM Performances and Material Microscopic Properties Based on Electrical Characterization and Atomistic Simulations von Nail, Cecile, Molas, Gabriel, Blaise, Philippe, Sklenard, Benoit, Berthier, Remy, Bernard, Mathieu, Perniola, Luca, Ghibaudo, Gerard, Vallee, Christophe

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Investigation of Forming, SET, and Data Retention of Conductive-Bridge Random-Access Memory for Stack Optimization von Guy, Jeremy, Molas, Gabriel, Blaise, Philippe, Bernard, Mathieu, Roule, Anne, Le Carval, Gilles, Delaye, Vincent, Toffoli, Alain, Ghibaudo, Gerard, Clermidy, Fabien, De Salvo, Barbara, Perniola, Luca

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A Combined Ab Initio and Experimental Study on the Nature of Conductive Filaments in Pt/HfO2/Pt Resistive Random Access Memory von Xue, Kan-Hao, Traoré, Boubacar, Blaise, Philippe, Fonseca, Leonardo, Vianello, Elisa, Molas, Gabriel, de Salvo, Barbara, Ghibaudo, Gérard, Magyari-Kope, Blanka, Nishi, Yoshio

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Hybrid‐RRAM toward Next Generation of Nonvolatile Memory: Coupling of Oxygen Vacancies and Metal Ions von Sassine, Gilbert, Nail, Cécile, Blaise, Philippe, Sklenard, Benoit, Bernard, Mathieu, Gassilloud, Rémy, Marty, Aurélie, Veillerot, Marc, Vallée, Christophe, Nowak, Etienne, Molas, Gabriel

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(Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions von Molas, Gabriel, Sassine, Gilbert, Nail, Cecile, Alfaro Robayo, Diego, Nodin, Jean-François, Cagli, Carlo, Coignus, Jean, Blaise, Philippe, Nowak, Etienne

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HfO sub(2)-Based RRAM: Electrode Effects, Ti/HfO sub(2) Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and Ab Initio Calculations von Traore, Boubacar, Blaise, Philippe, Vianello, Elisa, Perniola, Luca, De Salvo, Barbara, Nishi, Yoshio

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