Radiation Effects on Ytterbium- and Ytterbium/Erbium-Doped Double-Clad Optical Fibers von Girard, S., Ouerdane, Y., Tortech, B., Marcandella, C., Robin, T., Cadier, B., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Schwank, J.R., Shaneyfelt, M.R., Dodd, P.E., Blackmore, E.W.

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Proton- and Gamma-Induced Effects on Erbium-Doped Optical Fibers von Girard, S., Tortech, B., Regnier, E., Van Uffelen, M., Gusarov, A., Ouerdane, Y., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Berghmans, F., Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Blackmore, E.W., Thienpont, H.

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Proton-Induced Upsets in 41-nm NAND Floating Gate Cells von Gerardin, S., Bagatin, M., Paccagnella, A., Schwank, J. R., Shaneyfelt, M. R., Blackmore, E. W.

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The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate von Dodds, N. A., Martinez, M. J., Dodd, P. E., Shaneyfelt, M. R., Sexton, F. W., Black, J. D., Lee, D. S., Swanson, S. E., Bhuva, B. L., Warren, K. M., Reed, R. A., Trippe, J., Sierawski, B. D., Weller, R. A., Mahatme, N., Gaspard, N. J., Assis, T., Austin, R., Weeden-Wright, S. L., Massengill, L. W., Swift, G., Wirthlin, M., Cannon, M., Liu, R., Chen, L., Kelly, A. T., Marshall, P. W., Trinczek, M., Blackmore, E. W., Wen, S.-J, Wong, R., Narasimham, B., Pellish, J. A., Puchner, H.

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Comparison of charge yield in MOS devices for different radiation sources von Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flarrient, O., Blackmore, E.W.

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Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam von Dodds, N. A., Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E., Doyle, B. L., Trinczek, M., Blackmore, E. W., Rodbell, K. P., Gordon, M. S., Reed, R. A., Pellish, J. A., LaBel, K. A., Marshall, P. W., Swanson, S. E., Vizkelethy, G., Van Deusen, S., Sexton, F. W., Martinez, M. J.

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Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation-Implications for Digital SETs von Ferlet-Cavrois, V., Paillet, P., Gaillardin, M., Lambert, D., Baggio, J., Schwank, J.R., Vizkelethy, G., Shaneyfelt, M.R., Hirose, K., Blackmore, E.W., Faynot, O., Jahan, C., Tosti, L.

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LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics von Hiemstra, D.M., Blackmore, E.W.

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Total dose hardness assurance testing using laboratory radiation sources von Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flament, O., Blackmore, E.W.

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Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs von Baggio, J., Ferlet-Cavrois, V., Lambert, D., Paillet, P., Wrobel, F., Hirose, K., Saito, H., Blackmore, E.W.

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Search for heavy neutrinos in K + → μ + ν H decays von Artamonov, A. V., Bassalleck, B., Bhuyan, B., Blackmore, E. W., Bryman, D. A., Chen, S., Chiang, I-H., Christidi, I.-A., Cooper, P. S., Diwan, M. V., Frank, J. S., Fujiwara, T., Hu, J., Ives, J., Izmaylov, A. O., Jaffe, D. E., Kabe, S., Kettell, S. H., Khabibullin, M. M., Khotjantsev, A. N., Kitching, P., Kobayashi, M., Komatsubara, T. K., Konaka, A., Kudenko, Yu. G., Landsberg, L. G., Lewis, B., Li, K. K., Littenberg, L. S., Macdonald, J. A., Mildenberger, J., Mineev, O. V., Miyajima, M., Mizouchi, K., Muramatsu, N., Nakano, T., Nomachi, M., Nomura, T., Numao, T., Obraztsov, V. F., Omata, K., Patalakha, D. I., Poutissou, R., Redlinger, G., Sato, T., Sekiguchi, T., Shaikhiev, A. T., Shinkawa, T., Strand, R. C., Sugimoto, S., Tamagawa, Y., Tschirhart, R., Tsunemi, T., Vavilov, D. V., Viren, B., Wang, Zhe, Wei, Hanyu, Yershov, N. V., Yoshimura, Y., Yoshioka, T.

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Search for the decay K + → π + γ γ in the π + momentum region P > 213   MeV / c von Artamonov, A.V., Bassalleck, B., Bhuyan, B., Blackmore, E.W., Bryman, D.A., Chen, S., Chiang, I.-H., Christidi, I.-A., Cooper, P.S., Diwan, M.V., Frank, J.S., Fujiwara, T., Hu, J., Jaffe, D.E., Kabe, S., Kettell, S.H., Khabibullin, M.M., Khotjantsev, A.N., Kitching, P., Kobayashi, M., Komatsubara, T.K., Konaka, A., Kozhevnikov, A.P., Kudenko, Yu.G., Kushnirenko, A., Landsberg, L.G., Lewis, B., Li, K.K., Littenberg, L.S., Macdonald, J.A., Mildenberger, J., Mineev, O.V., Miyajima, M., Mizouchi, K., Mukhin, V.A., Muramatsu, N., Nakano, T., Nomachi, M., Nomura, T., Numao, T., Obraztsov, V.F., Omata, K., Patalakha, D.I., Petrenko, S.V., Poutissou, R., Ramberg, E.J., Redlinger, G., Sato, T., Sekiguchi, T., Shinkawa, T., Strand, R.C., Sugimoto, S., Tamagawa, Y., Tschirhart, R., Tsunemi, T., Vavilov, D.V., Viren, B., Yershov, N.V., Yoshimura, Y., Yoshioka, T.

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New Measurement of the K + → π + ν ν ¯ Branching Ratio von Artamonov, A. V., Bassalleck, B., Bhuyan, B., Blackmore, E. W., Bryman, D. A., Chen, S., Chiang, I-H., Christidi, I.-A., Cooper, P. S., Diwan, M. V., Frank, J. S., Fujiwara, T., Hu, J., Ives, J., Jaffe, D. E., Kabe, S., Kettell, S. H., Khabibullin, M. M., Khotjantsev, A. N., Kitching, P., Kobayashi, M., Komatsubara, T. K., Konaka, A., Kozhevnikov, A. P., Kudenko, Yu. G., Kushnirenko, A., Landsberg, L. G., Lewis, B., Li, K. K., Littenberg, L. S., Macdonald, J. A., Mildenberger, J., Mineev, O. V., Miyajima, M., Mizouchi, K., Mukhin, V. A., Muramatsu, N., Nakano, T., Nomachi, M., Nomura, T., Numao, T., Obraztsov, V. F., Omata, K., Patalakha, D. I., Petrenko, S. V., Poutissou, R., Ramberg, E. J., Redlinger, G., Sato, T., Sekiguchi, T., Shinkawa, T., Strand, R. C., Sugimoto, S., Tamagawa, Y., Tschirhart, R., Tsunemi, T., Vavilov, D. V., Viren, B., Wang, Zhe, Yershov, N. V., Yoshimura, Y., Yoshioka, T.

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Radiation Effects of Protons on Samarium-Cobalt Permanent Magnets von Blackmore, E. W.

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Hardness Assurance Testing for Proton Direct Ionization Effects von Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Dodd, P. E., Blackmore, E. W., Pellish, J. A., Rodbell, K. P., Heidel, D. F., Marshall, P. W., LaBel, K. A., Gouker, P. M., Tam, N., Wong, R., Shi-Jie Wen, Reed, R. A., Dalton, S. M., Swanson, S. E.

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High gradient magnetic separation of cells on the basis of expression levels of cell surface antigens von Thomas, Terry E., Abraham, Sara J.R., Otter, Alan J., Blackmore, Ewart W., Lansdorp, Peter M.

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The Effect of High-Z Materials on Proton-Induced Charge Collection von Clemens, M A, Hooten, N C, Ramachandran, V, Dodds, N A, Weller, R A, Mendenhall, M H, Reed, R A, Dodd, P E, Shaneyfelt, M R, Schwank, J R, Blackmore, E W

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Radiation Effects in 3D Integrated SOI SRAM Circuits von Gouker, P. M., Tyrrell, B., D'Onofrio, R., Wyatt, P., Soares, T., Weilin Hu, Chenson Chen, Schwank, J. R., Shaneyfelt, M. R., Blackmore, E. W., Delikat, K., Nelson, M., McMarr, P., Hughes, H., Ahlbin, J. R., Weeden-Wright, S., Schrimpf, R.

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Search for the rare decay K + → μ + ν ν ¯ ν von Artamonov, A. V., Bassalleck, B., Bhuyan, B., Blackmore, E. W., Bryman, D. A., Chen, S., Chiang, I-H., Christidi, I.-A., Cooper, P. S., Diwan, M. V., Frank, J. S., Fujiwara, T., Hu, J., Ives, J., Izmaylov, A. O., Jaffe, D. E., Kabe, S., Kettell, S. H., Khabibullin, M. M., Khotjantsev, A. N., Kitching, P., Kobayashi, M., Komatsubara, T. K., Konaka, A., Kudenko, Yu. G., Landsberg, L. G., Lewis, B., Li, K. K., Littenberg, L. S., Macdonald, J. A., Mildenberger, J., Mineev, O. V., Miyajima, M., Mizouchi, K., Muramatsu, N., Nakano, T., Nomachi, M., Nomura, T., Numao, T., Obraztsov, V. F., Omata, K., Patalakha, D. I., Poutissou, R., Redlinger, G., Sato, T., Sekiguchi, T., Shaikhiev, A. T., Shinkawa, T., Strand, R. C., Sugimoto, S., Tamagawa, Y., Tschirhart, R., Tsunemi, T., Vavilov, D. V., Viren, B., Wang, Zhe, Wei, Hanyu, Yershov, N. V., Yoshimura, Y., Yoshioka, T.

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Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing von Shaneyfelt, M.R., Felix, J.A., Dodd, P.E., Schwank, J.R., Dalton, S.M., Baggio, J., Ferlet-Cavrois, V., Paillet, P., Blackmore, E.W.

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