Retention and surface blistering of helium irradiated tungsten as a first wall material von Gilliam, S.B., Gidcumb, S.M., Parikh, N.R., Forsythe, D.G., Patnaik, B.K., Hunn, J.D., Snead, L.L., Lamaze, G.P.

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Deposition of copper oxide thin films on different substrates by pulsed excimer laser ablation von OGALE, S. B, BILURKAR, P. G, MATE, N, KANETKAR, S. M, NALIN PARIKH, BIJOY PATNAIK

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Mechanisms of epitaxial CoSi2 formation in the multilayer Co/Ti-Si(100) system von Hong, Feng, Rozgonyi, George A., Patnaik, Bijoy K.

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Trilayered heterostructures in in-situ laser deposited high temperature superconductors von Kumar, Ashok, Narayan, J., Patnaik, Bijoy

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Microstructural analysis on helium retention of ion-irradiated and annealed tungsten foils von Hashimoto, N., Hunn, J.D., Parikh, N., Gilliam, S., Gidcumb, S., Patnaik, B., Snead, L.L.

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Determination of Si2p electron attenuation lengths in SiO2 von FULGHUM, J. E, STOKELL, R, MCGUIRE, G, PATNAIK, B, YU, N, ZHAO, Y. J, PARIKH, N

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Realization of Y1Ba2Cu3O7-δ/Y-ZrO2 epitaxial configuration on silicon (100) by pulsed laser ablation without chemical removal of native surface oxide von VISPUTE, R. D, KANETKAR, S. M, OGALE, S. B, RAJKUMAR, K. C, ANUPAM MADHUKAR, NALIN PARIKH, BIJOY PATNAIK

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Solution-grown CdS layers for polycrystalline-thin-film solar cells von Dhere, N.G., Waterhouse, D.L., Sundaram, K.B., Melendez, O., Parikh, N.R., Patnaik, B.K.

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Nanoscale CoSi2 contact layer growth from deposited Co/Ti multilayers on Si substrates von HONG, F, ROZGONYI, G. A, PATNAIK, B

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The morphology of thick evaporated aluminium films and their purity as determined by proton-induced x-ray analysis von Dhere, Neelkanth G., Arsenio, Therezinha P., Patnaik, Bijoy K.

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Purity and morphology of aluminium films von Dhere, Neelkanth G., Arsenio, Therezinha P., Patnaik, Bijoy K.

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Realization of Y 1Ba 2Cu 3O 7−δ/Y-ZrO 2 epitaxial configuration on silicon (100) by pulsed laser ablation without chemical removal of native surface oxide von Vispute, R.D, Kanetkar, S.M, Ogale, S.B, Rajkumar, K.C, Madhukar, Anupam, Parikh, Nalin, Patnaik, Bijoy

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Determination of Si2p electron attenuation lengths in SiO 2 von Fulghum, Julia E., Stokell, Richard, McGuire, Gary, Patnaik, Bijoy, Yu, Ning, Zhao, Y.J., Parikh, Nalin

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Channeling effect of P implantation in Si(100) von Ning, Yu, Wei-Kan, Chu, Patnaik, Bijoy, Parikh, Nalin, Corcoran, Sean, Kirschbaum, Charles, Varahramyan, Kody

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Conductivity-type inversion following low-energy hydrogen implantation von TIAN-QUN ZHOU, RADZIMSKI, Z, PATNAIK, B, ROZGONYI, G. A, SOPORI, B

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COMPOSITION ANALYSIS OF HIGH Tc Bi-Sr-Ca-Cu-O THIN FILMS BY RBS AND EPMA von Dhere, Neelkanth G., Goral, John P., Mason, Alice R., Parikh, Nalin R., Patnaik, Bijoy K.

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Trace element analysis in thick targets by charged particle induced X-rays von Patnaik, Bijoy K., Dhere, Neelkanth G.

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YIG based broad band microwave absorber: A perspective on synthesis methods von Sharma, Vinay, Saha, J., Patnaik, S., Kuanr, Bijoy K.

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Spin dynamics of room temperature van der Waals (vdW) ferromagnets and their usage in microwave devices von Kumar, Pardeep, Patnaik, Satyabrata, Kuanr, Bijoy K.

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Crystal orientation dependent spin pumping in a Bi0.1Y2.9Fe5O12/Pt interface von Gurjar, Ganesh, Sharma, Vinay, De, Avirup, Nair, Sunil, Patnaik, S, Kuanr, Bijoy K

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