Fourier transform infrared spectroscopy investigation of chemical bonding in low-k a-SiC:H thin films von King, S.W., French, M., Bielefeld, J., Lanford, W.A.

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Defect structure and electronic properties of SiOC:H films used for back end of line dielectrics von Pomorski, T. A., Bittel, B. C., Lenahan, P. M., Mays, E., Ege, C., Bielefeld, J., Michalak, D., King, S. W.

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Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy von King, S W, Bielefeld, J, French, M, Lanford, WA

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Cardiac Tumors in Infants and Children: Study of 120 Operated Patients von Bielefeld, Kyle J., Moller, James H.

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Nuclear reaction analysis for H, Li, Be, B, C, N, O and F with an RBS check von Lanford, W.A., Parenti, M., Nordell, B.J., Paquette, M.M., Caruso, A.N., Mäntymäki, M., Hämäläinen, J., Ritala, M., Klepper, K.B., Miikkulainen, V., Nilsen, O., Tenhaeff, W., Dudney, N., Koh, D., Banerjee, S.K., Mays, E., Bielefeld, J., King, S.W.

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Defects and electronic transport in hydrogenated amorphous SiC films of interest for low dielectric constant back end of the line dielectric systems von Pomorski, T. A., Bittel, B. C., Cochrane, C. J., Lenahan, P. M., Bielefeld, J., King, S. W.

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Fracture properties of hydrogenated amorphous silicon carbide thin films von Matsuda, Y., King, S.W., Bielefeld, J., Xu, J., Dauskardt, R.H.

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Mechanical property changes in porous low- k dielectric thin films during processing von Stan, G., Gates, R. S., Kavuri, P., Torres, J., Michalak, D., Ege, C., Bielefeld, J., King, S. W.

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Thermal Conductivity Measurement of Low-k Dielectric Films: Effect of Porosity and Density von Alam, M. T., Pulavarthy, R. A., Bielefeld, J., King, S. W., Haque, M. A.

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Self-Assembly of a Two-Dimensional Superlattice of Molecularly Linked Metal Clusters von Andres, Ronald P., Bielefeld, Jeffery D., Henderson, Jason I., Janes, David B., Kolagunta, Venkat R., Kubiak, Clifford P., Mahoney, William J., Osifchin, Richard G.

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Thermal conductivity and sound velocity measurements of plasma enhanced chemical vapor deposited a-SiC:H thin films von Hondongwa, D.B., Olasov, L.R., Daly, B.C., King, S.W., Bielefeld, J.

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Case report: Oseltamivir-induced resistant pandemic influenza A (H1N1) Virus infection in a patient with AIDS and Pneumocystis jirovecii pneumonia von van Kampen, Jeroen J.A., Bielefeld-Buss, Astrid J., Ott, Alewijn, Maaskant, Jolanda, Faber, Harald J., Lutisan, Johan G., Boucher, Charles A.B.

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Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy von KING, S. W, BIELEFELD, J, FRENCH, M, LANFORD, W. A

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Limits of decoding mental states with fMRI von Jabakhanji, Rami, Vigotsky, Andrew D., Bielefeld, Jannis, Huang, Lejian, Baliki, Marwan N., Iannetti, Giandomenico, Apkarian, A. Vania

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Elastic properties of porous low-k dielectric nano-films von Zhou, W., Bailey, S., Sooryakumar, R., King, S., Xu, G., Mays, E., Ege, C., Bielefeld, J.

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Novel use of an Amplatzer Vascular Occluder II to close an acquired fistula between a reconstructed aortic arch and the left atrial appendage in a patient with hypoplastic left hea... von Bielefeld, Kyle J., Seib, Paul M., Fontenot, Eudice E.

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The Pediatrician's Dilemma: Respecting Parental Autonomy Versus Protecting Vulnerable Children von Gomez, Michael R., Bielefeld, Kyle J., Escala, Michelle K., Munoz, Ric T., Fox, Mark D.

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Characterization of Porous BEOL Dielectrics for Resistive Switching von Fan, Ye, King, Sean W., Bielefeld, Jeff, Orlowski, Marius K

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Valence band offset at the amorphous hydrogenated boron nitride-silicon (100) interface von King, S. W., French, M., Bielefeld, J., Jaehnig, M., Kuhn, M., Xu, G., French, B.

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Corrigendum to “Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy” [J. Non-Cryst. Solids 357 (2011) 3602–3615] von King, S.W., Bielefeld, J., French, M., Lanford, W.A.

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