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  1. 1
    Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline Al2O3-Based Devices Studied With AFM-Related Techniques

    Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline Al2O3-Based Devices Studied With AFM-Related Techniques von LANZA, Mario, PORTI, Marc, PIOTR MICHALOWSKI, Pawel, NAFRIA, Montserrat, AYMERICH, Xavier, BENSTETTER, Giinther, LODERMEIER, Edgar, RANZINGER, Heiko, JASCHKE, Gert, TEICHERT, Steffen, WILDE, Lutz


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  2. 2
    Surface and electron emission properties of hydrogen-free diamond-like carbon films investigated by atomic force microscopy

    Surface and electron emission properties of hydrogen-free diamond-like carbon films investigated by atomic force microscopy von Liu, Dongping, Zhang, Sam, Ong, Soon-Eng, Benstetter, Günther, Du, Hejun


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  3. 3
    Conducting atomic force microscopy for nanoscale electron emissions from various diamond-like carbon films

    Conducting atomic force microscopy for nanoscale electron emissions from various diamond-like carbon films von Liu, Dongping, Benstetter, Günther

    Veröffentlicht in Applied surface science

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