Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation von Beckhoff, Burkhard

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Complementary techniques for the reliable characterisation of tissue samples: A case study on pancreatic tumours analysed by means of X-ray fluorescence analysis and IR spectroscop... von Frenzel, Katja, Kayser, Yves, Hornemann, Andrea, Kästner, Bernd, Hoehl, Arne, Mouratidis, Petros, Rivens, Ian, Ter Haar, Gail, Beckhoff, Burkhard

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Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy von Hermann, Peter, Hoehl, Arne, Ulrich, Georg, Fleischmann, Claudia, Hermelink, Antje, Kästner, Bernd, Patoka, Piotr, Hornemann, Andrea, Beckhoff, Burkhard, Rühl, Eckart, Ulm, Gerhard

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A quarter-century of metrology using synchrotron radiation by PTB in Berlin von Beckhoff, Burkhard, Gottwald, Alexander, Klein, Roman, Krumrey, Michael, Müller, Ralph, Richter, Mathias, Scholze, Frank, Thornagel, Reiner, Ulm, Gerhard

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Summary of ISO standard 20289: Total reflection X‐ray fluorescence analysis of water von Borgese, Laura, Bilo, Fabjola, Federici, Stefania, Margui, Eva, Hase, Thomas, Huang, Yuying, Beckhoff, Burkhard, Depero, Laura E.

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Reference-free X-ray spectrometry based on metrology using synchrotron radiation von Beckhoff, Burkhard

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Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking von Cara, Eleonora, Hönicke, Philipp, Kayser, Yves, Beckhoff, Burkhard, Giovannozzi, Andrea M., Klapetek, Petr, Zoccante, Alberto, Cossi, Maurizio, Tay, Li-Lin, Boarino, Luca, Ferrarese Lupi, Federico

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Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant von Müller, Matthias, Beckhoff, Burkhard, Beyer, Edyta, Darlatt, Erik, Fliegauf, Rolf, Ulm, Gerhard, Kolbe, Michael

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Quantification of Element Mass Concentrations in Ambient Aerosols by Combination of Cascade Impactor Sampling and Mobile Total Reflection X-ray Fluorescence Spectroscopy von Seeger, Stefan, Osan, Janos, Czömpöly, Ottó, Gross, Armin, Stosnach, Hagen, Stabile, Luca, Ochsenkuehn-Petropoulou, Maria, Tsakanika, Lamprini Areti, Lymperopoulou, Theopisti, Goddard, Sharon, Fiebig, Markus, Gaie-Levrel, Francois, Kayser, Yves, Beckhoff, Burkhard

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Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates von Delabie, Annelies, Sioncke, Sonja, Rip, Jens, Van Elshocht, Sven, Pourtois, Geoffrey, Mueller, Matthias, Beckhoff, Burkhard, Pierloot, Kristine

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Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al von Becker, Christiane, Pagels, Marcel, Zachaeus, Carolin, Pollakowski, Beatrix, Beckhoff, Burkhard, Kanngieser, Birgit, Rech, Bernd

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Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples von Staeck, Steffen, Andrle, Anna, Hönicke, Philipp, Baumann, Jonas, Grötzsch, Daniel, Weser, Jan, Goetzke, Gesa, Jonas, Adrian, Kayser, Yves, Förste, Frank, Mantouvalou, Ioanna, Viefhaus, Jens, Soltwisch, Victor, Stiel, Holger, Beckhoff, Burkhard, Kanngießer, Birgit

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Resonant X-ray Emission of Hexagonal Boron Nitride von Vinson, John, Jach, Terrence, Müller, Matthias, Unterumsberger, Rainer, Beckhoff, Burkhard

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Reinhold Klockenkämper and Alex von Bohlen: Total-reflection X-ray fluorescence analysis and related methods, 2nd ed von Beckhoff, Burkhard

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Nondestructive Speciation Depth Profiling of Complex TiOx Nanolayer Structures by Grazing Incidence X-ray Fluorescence Analysis and Near Edge X-ray Absorption Fine Structure Spectr... von Pollakowski, Beatrix, Beckhoff, Burkhard

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Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry von Kolbe, Michael, Beckhoff, Burkhard, Krumrey, Michael, Ulm, Gerhard

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In Situ Electric-Field Study of Surface Effects in Domain Engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Relaxor Crystals by Grazing Incidence Diffraction von Cain, Markys G., Staruch, Margo, Thompson, Paul, Lucas, Christopher, Wermeille, Didier, Kayser, Yves, Beckhoff, Burkhard, Lofland, Sam E., Finkel, Peter

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The present and future of microcalorimeter X-ray detectors for fundamental X-ray parameters von Jach, Terrence, Thurgate, Stephen, Beckhoff, Burkhard

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Fabrication of FeNi hydroxides double-shell nanotube arrays with enhanced performance for oxygen evolution reaction von Yu, Nan, Cao, Wei, Huttula, Marko, Kayser, Yves, Hoenicke, Philipp, Beckhoff, Burkhard, Lai, Fengyu, Dong, Ruohao, Sun, Hongxia, Geng, Baoyou

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Experimental determination of tantalum L-shell fluorescence yields and Coster–Kronig transition probabilities von Wauschkuhn, Nils, Frenzel, Katja, Beckhoff, Burkhard, Hönicke, Philipp

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