Continuous prediction of manufacturing performance throughout the production lifecycle von Weiss, Sholom M., Dhurandhar, Amit, Baseman, Robert J., White, Brian F., Logan, Ronald, Winslow, Jonathan K., Poindexter, Daniel

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A Unified Framework for Outlier Detection in Trace Data Analysis von Li, Zhiguo, Baseman, Robert J., Zhu, Yada, Tipu, Fateh A., Slonim, Noam, Shpigelman, Lavi

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Data analytics and stochastic modeling in a semiconductor fab von Bagchi, Sugato, Baseman, Robert J., Davenport, Andrew, Natarajan, Ramesh, Slonim, Noam, Weiss, Sholom

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Rule-based data mining for yield improvement in semiconductor manufacturing von Weiss, Sholom M., Baseman, Robert J., Tipu, Fateh, Collins, Christopher N., Davies, William A., Singh, Raminderpal, Hopkins, John W.

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OPTIMAL MATERIALS AND DEVICES DESIGN USING ARTIFICIAL INTELLIGENCE von Baseman, Robert Jeffrey, Phan, Dzung Tien

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A System and Benchmark for LLM-based Q&A on Heterogeneous Data von Fokoue, Achille, Jayaraman, Srideepika, Khabiri, Elham, Kephart, Jeffrey O, Li, Yingjie, Shah, Dhruv, Drissi, Youssef, HeathIII, Fenno F, Bhamidipaty, Anu, Tipu, Fateh A, Baseman, Robert J

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Minimum fluence for laser blow-off of thin gold films at 248 and 532 nm von BASEMAN, R. J, FROBERG, N. M, ANDRESHAK, J. C, SCHLESINGER, Z

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DETECTING AND MITIGATING SYSTEM ANOMALIES USING KNOWLEDGE GRAPHS von Agrawal, Bhavna, Baseman, Robert Jeffrey, Li, Yingjie, Bhamidipaty, Anuradha, Kephart, Jeffrey Owen, Jayaraman, Srideepika, Khabiri, Elham

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Vehicle asset modeling using language processing methods von Baseman, Robert Jeffrey, Bhamidipaty, Anuradha, Jayaraman, Srideepika, Reddy, Chandrasekhara K, Khabiri, Elham

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Tool control using multistage LSTM for predicting on-wafer measurements von Robert Baseman, Ramachandran Muralidhar, Fateh Tipu, Nam Nguyen, Dzung Tien Phan

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Model management for non-stationary systems von Baseman, Robert Jeffrey, Muralidhar, Ramachandran, Nguyen, Nam H, Phan, Dung Tien, Tipu, Fateh Ali

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USING SEQUENCE MINING TO PREDICT QUALITY AND YIELD von Agrawal, Bhavna, Baseman, Robert Jeffrey, Li, Yingjie, Bhamidipaty, Anuradha, Kephart, Jeffrey Owen, Jayaraman, Srideepika, Khabiri, Elham

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AUTOMATED OPERATING MODE DETECTION FOR A MULTI-MODAL SYSTEM von Baseman, Robert Jeffrey, Patel, Dhavalkumar C, Tipu, Fateh A, Phan, Dzung Tien

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Trimethylenemethane. Experimental demonstration that the triplet state is the ground state von Baseman, Robert J, Pratt, David W, Chow, Mudan, Dowd, Paul

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Wafer asset modeling using language processing methods von Baseman, Robert Jeffrey, Bhamidipaty, Anuradha, Jayaraman, Srideepika, Reddy, Chandrasekhara K, Khabiri, Elham

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MODEL MANAGEMENT FOR NON-STATIONARY SYSTEMS von BASEMAN, Robert, NGUYEN, Nam, MURALIDHAR, Ramachandran, PHAN, Dung, TIPU, Fateh

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STATISTICAL FRAMEWORK FOR TOOL CHAMBER MATCHING IN SEMICONDUCTOR MANUFACTURING PROCESSES von LI, Zhiguo, BASEMAN, Robert J

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A System and Benchmark for LLM-based Q&A on Heterogeneous Data von Fokoue, Achille, Jayaraman, Srideepika, Khabiri, Elham, Kephart, Jeffrey O, Li, Yingjie, Shah, Dhruv, Drissi, Youssef, Heath, Fenno F, Bhamidipaty, Anu, Tipu, Fateh A, Baseman, Robert J

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Anomaly detection and remedial recommendation von Phan, Dzung, Baseman, Robert, Muralidhar, Ramachandran, Nguyen, Nam H, Tipu, Fateh

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Tool control using multistage LSTM for predicting on-wafer measurements von Robert Baseman, Ramachandran Muralidhar, Fateh Tipu, Nam Nguyen, Dzung Tien Phan

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