Trends in Electromagnetism: From Fundamentals to Applications von Victor Barsan, Radu P. Lungu

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Device fabrication with planar bragg gratings suppressing parasitic effects von BARSAN RADU, STOLPNER LEW

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DEVICE FABRICATION WITH PLANAR BRAGG GRATINGS SUPPRESSING PARASITIC EFFECTS von BARSAN RADU, STOLPNER LEW

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DEVICE FABRICATION WITH PLANAR BRAGG GRATINGS SUPPRESSING PARASITIC EFFECTS von STOLPNER, LEW, BARSAN, RADU

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Decoder circuit with short channel depletion transistors von BARSAN, RADU M

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Method for screening non-volatile memory and programmable logic devices von BARSAN, RADU, LIN, JONATHAN

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CONTROL GATE-ADDRESSED CMOS NON-VOLATILE CELL THAT PROGRAMS THROUGH GATES OF CMOS TRANSISTORS von BARSAN, RADU, LIN, JONATHAN

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Analysis and modeling of dual-gate MOSFET's von Barsan, R.M.

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CONTROL GATE-ADDRESSED CMOS NON-VOLATILE CELL THAT PROGRAMS THROUGH GATES OF CMOS TRANSISTORS von BARSAN, RADU, LIN, JONATHAN

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Control gate-addressed CMOS non-volatile cell that programs through gates of CMOS transistors von BARSAN, RADU, LIN, JONATHAN

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Annealing of silicon oxynitride and silicon nitride films to eliminate high temperature charge loss von BARSAN, RADU, MEHTA, SUNIL D

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Simplified masking process for programmable logic device manufacture von BARSAN, RADU, MEHTA, SUNIL D

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Characterization of charge-transfer devices with position-dependent small-signal transfer inefficiency von BARSAN, RADU M.

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Subthreshold current of dual-gate MOSFET's von Barsan, R.M.

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IMPROVING FIELD LEAKAGE BY USING A THIN LAYER OF NITRIDE DEPOSITED BY CHEMICAL VAPOR DEPOSITION von BARSAN RADU, LIN JONATHAN, MEHTA SUNIL

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IMPROVING FIELD LEAKAGE BY USING A THIN LAYER OF NITRIDE DEPOSITED BY CHEMICAL VAPOR DEPOSITION von LIN, JONATHAN, BARSAN, RADU, MEHTA, SUNIL

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Characteristics of the overlaid charge-coupled device von Barsan, R.M.

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Improving field leakage by using a thin layer of nitride deposited by chemical vapor deposition von BARSAN RADU, LIN JONATHAN, MEHTA SUNIL

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Green's function calculation of electric fields in surface-channel charge-coupled devices von BARSAN, RADU M.

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Transient behaviour of the gate potential in an MOS transmission line von BARSAN, RADU M.

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