An investigation of commercial gamma-Al2O3 nanoparticles von Rozita, Y, Brydson, R, Scott, A J

Volltext

Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning von Griffiths, A J V, Walther, T

Volltext

An integrated multiple silicon drift detector system for transmission electron microscopes von Harrach, H S von, Dona, P, Freitag, B, Soltau, H, Niculae, A, Rohde, M

Volltext

Probe position recovery for ptychographical imaging von Hurst, A C, Edo, T B, Walther, T, Sweeney, F, Rodenburg, J M

Volltext

HAADF-STEM imaging of CuAg core-shell nanoparticles von Langlois, C, Wang, Z W, Pearmain, D, Ricolleau, C, Li, Z Y

Volltext

An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors von Walther, T

Volltext

Imaging the structure of activated carbon using aberration corrected TEM von Harris, P J F, Liu, Z, Suenaga, K

Volltext

A practical approach to test the scope of FIB-SEM 3D reconstruction von Ritter, M, Midgley, P A

Volltext

Angstrom analysis with dynamic in-situ aberration corrected electron microscopy von Gai, P L, Boyes, E D

Volltext

TEM investigation of MgO thin films for magnetic tunnel junction application von Harnchana, V, Hindmarch, A T, Brown, A P, Brydson, R M, Marrows, C H

Volltext

Elemental mapping in scanning transmission electron microscopy von Allen, L J, D'Alfonso, A J, Findlay, S D, LeBeau, J M, Lugg, N R, Stemmer, S

Volltext

Effect of ECAP on microstructure and mechanical properties of cast AZ91 magnesium alloy von Chung, C W, Ding, R G, Chiu, Y L, Gao, W

Volltext

In-situ heating studies of gold nanoparticles in an aberration corrected transmission electron microscope von Walsh, M J, Yoshida, K, Gai, P L, Boyes, E D

Volltext

UV-Vis plasmon studies of metal nanoparticles von Eccles, J W L, Bangert, U, Bromfield, M, Christian, P, Harvey, A J, Thomas, P

Volltext

Electronic structure of oxide fuels from experiment and first principles calculations von Aguiar, J A, Grönbech-Jensen, N, Perlov, A, Milman, V, Gao, S P, Pickard, C J, Browning, N D

Volltext

Application of lattice strain analysis of semiconductor device by nano-beam diffraction using the 300 kV Cold-FE TEM von Sato, T, Matsumoto, H, Nakano, K, Konno, M, Fukui, M, Nagaoki, I, Taniguchi, Y

Volltext

Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations von Hÿtch, M J, Houdellier, F, Hüe, F, Snoeck, E

Volltext

ZnO as sintering additive in Sr2Nb2O7 von Iqbal, Y, Manan, A, Safeen, M K, Khan, A

Volltext

Sol-gel synthesis and characterisation of nano-scale hydroxyapatite von Bilton, M, Brown, A P, Milne, S J

Volltext

Energy filtered scanning electron microscopy: applications to characterisation of semiconductors von Rodenburg, C, Jepson, M A E, Inkson, B J, Bosch, E G T, Humphreys, C J

Volltext