Treffer 1 - 5 von 5 für Suche 'Büschges, M. Isabelle', Suchdauer: 0,63s Treffer weiter einschränken
  1. 1
    Gas phase synthesis and adsorption properties of a 3D ZIF-8 CNT composite

    Gas phase synthesis and adsorption properties of a 3D ZIF-8 CNT composite von Dönges, Inga, Büschges, M. Isabelle, Njel, Christian, Schneider, Jörg J


    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  2. 2
    Electronic influence of ultrathin aluminum oxide on the transistor device performance of binary indium/tin oxide films

    Electronic influence of ultrathin aluminum oxide on the transistor device performance of binary indium/tin oxide films von Büschges, M. Isabelle, Trouillet, Vanessa, Schneider, Jörg J


    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  3. 3
    Atomic Layer Deposition of Ternary Indium/Tin/Aluminum Oxide Thin Films, Their Characterization and Transistor Performance under Illumination

    Atomic Layer Deposition of Ternary Indium/Tin/Aluminum Oxide Thin Films, Their Characterization and Transistor Performance under Illumination von Büschges, M. Isabelle, Hoffmann, Rudolf C., Regoutz, Anna, Schlueter, Christoph, Schneider, Jörg J.

    Veröffentlicht in Chemistry : a European journal

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  4. 4
    Cover Feature: Atomic Layer Deposition of Ternary Indium/Tin/Aluminum Oxide Thin Films, Their Characterization and Transistor Performance under Illumination. (Chem. Eur. J. 38/2021)

    Cover Feature: Atomic Layer Deposition of Ternary Indium/Tin/Aluminum Oxide Thin Films, Their Characterization and Transistor Performance under Illumination. (Chem. Eur. J. 38/2021... von Büschges, M. Isabelle, Hoffmann, Rudolf C., Regoutz, Anna, Schlueter, Christoph, Schneider, Jörg J.

    Veröffentlicht in Chemistry : a European journal

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:
  5. 5
    Amorphous Doped Indium Tin Oxide Thin‐Films by Atomic Layer Deposition.Insights into Their Structural, Electronic and Device Reliability

    Amorphous Doped Indium Tin Oxide Thin‐Films by Atomic Layer Deposition.Insights into Their Structural, Electronic and Device Reliability von Büschges, M. Isabelle, Trouillet, Vanessa, Dippel, Ann‐Christin, Schneider, Jörg J.

    Veröffentlicht in Advanced materials interfaces

    Volltext
    Artikel

    Zu den Favoriten
    Gespeichert in:

Suchwerkzeuge: