Defects limitation in epitaxial GaP on bistepped Si surface using UHVCVD–MBE growth cluster von Quinci, T., Kuyyalil, J., Thanh, T. Nguyen, Wang, Y. Ping, Almosni, S., Létoublon, A., Rohel, T., Tavernier, K., Chevalier, N., Dehaese, O., Boudet, N., Bérar, J.F., Loualiche, S., Even, J., Bertru, N., Corre, A. Le, Durand, O., Cornet, C.

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A detailed study of UO2 to U3O8 oxidation phases and the associated rate-limiting steps von Rousseau, G., Desgranges, L., Charlot, F., Millot, N., Nièpce, J.C., Pijolat, M., Valdivieso, F., Baldinozzi, G., Bérar, J.F.

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Comparison of three types of XPAD3.2/CdTe single chip hybrids for hard X-ray applications in material science and biomedical imaging von Buton, C., Dawiec, A., Graber-Bolis, J., Arnaud, K., Bérar, J.F., Blanc, N., Boudet, N., Clémens, J.C., Debarbieux, F., Delpierre, P., Dinkespiler, B., Gastaldi, T., Hustache, S., Morel, C., Pangaud, P., Perez-Ponce, H., Vigeolas, E.

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X-ray pixel detector for crystallography von Delpierre, P., Berar, J.F., Blanquart, L., Caillot, B., Clemens, J.C., Mouget, C.

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A 20kpixels CdTe photon-counting imager using XPAD chip von Basolo, S., Bérar, J.F., Boudet, N., Breugnon, P., Chantepie, B., Clémens, J.C., Delpierre, P., Dinkespiler, B., Hustache, S., Medjoubi, K., Ménouni, M., Morel, C., Pangaud, P., Vigeolas, E.

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Large surface X-ray pixel detector von Delpierre, P., Berar, J.F., Blanquart, L., Boudet, N., Breugnon, P., Caillot, B., Clemens, J.C., Mouget, C., Potheau, R., Valin, I.

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Magnetic anisotropy and chemical long-range order in epitaxial ferrimagnetic CrPt3 films von MARET, M, ALBRECHT, M, KÖHLER, J, POINSOT, R, ULHAQ-BOUILLET, C, TONNERRE, J. M, BERAR, J. F, BUCHER, E

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Orbital degrees of freedom and ordering phenomena in a 4 f system von Amara, M., Luca, S.E., Galéra, R.M., Aviani, I., Bérar, J.F.

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Rietveld Refinement of Two-Phase Zr-Doped Y2O3 von Bérar, J.F., Baldinozzi, Gianguido, Calvarin-Amiri, G.

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X-ray and electron diffraction analysis of the structure and the microstructure of the Y 3(Fe 0.933V 0.067) 29 compound von Lambert-Andron, B, Courtois, D, Pontonnier, L, Bérar, J.F

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Orbital degrees of freedom and ordering phenomena in a 4f system von Amara, M., Luca, S.E., Galéra, R.M., Aviani, I., Bérar, J.F.

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X-ray and electron diffraction analysis of the structure and the microstructure of the Y3(Fe0.933V0.067)29 compound von LAMBERT-ANDRON, B, COURTOIS, D, PONTONNIER, L, BERAR, J. F

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The incommensurate modulated structure of Sr14−xCaxC24O41 as a function of temperature and composition von Bougerol-Chaillout, C., Bordet, P., Bérar, J.F., Darie, C., Pachot, S.

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Refinement of Incommensurate Misfit Compounds: Sr14-xCaxCu24O41 von Bordet, P., Pachot, S., Bérar, J.F., Bougerol-Chaillout, C., Darie, C.

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Phason strain in a mechanically polished Al Pd Mn icosahedral single quasicrystal von Boudard, M., De Boissieu, M., Simon, J.P., Berar, J.F., Doisneau, B.

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The incommensurate modulated structure of Sr 14−xCa xC 24O 41 as a function of temperature and composition von Bougerol-Chaillout, C., Bordet, P., Bérar, J.F., Darie, C., Pachot, S.

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Anomalous Valence Contrast of Metal Transition in Nanocrystalline Ferrite von Lorimier, J., Bernard, Frédéric, Niepce, J.C., Bérar, J.F., Isnard, Olivier

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PIXSCAN: Pixel detector CT-scanner for small animal imaging von Delpierre, P., Debarbieux, F., Basolo, S., Berar, J.F., Bonissent, A., Boudet, N., Breugnon, P., Caillot, B., Cassol Brunner, F., Chantepie, B., Clemens, J.C., Dinkespiler, B., Khouri, R., Koudobine, I., Mararazzo, V., Meessen, C., Menouni, M., Morel, C., Mouget, C., Pangaud, P., Peyrin, F., Rougon, G., Sappey-Marinier, D., Valton, S., Vigeolas, E.

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Strain state in bcc Fe films grown on Si(1 1 1) von Stephan, R., Zabrocki, S., Wetzel, P., Berling, D., Mehdaoui, A., Bubendorff, J-L., Garreau, G., Pirri, C., Gewinner, G., Boudet, N., Berar, J.F.

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Rietveld Studies of the Aluminium-Iron Substitution in Synthetic Goethite von Bérar, J.F., Hazemann, J.-L., Manceau, A.

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