Calculation of Power Losses in Litz Wire Systems by Coupling FEM and PEEC Method von Rosskopf, Andreas, Bar, Eberhard, Joffe, Christopher, Bonse, Clemens

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Performance of vertical gate-all-around nanowire p-MOS transistors determined by boron depletion during oxidation von Rossi, Chiara, Burenkov, Alexander, Pichler, Peter, Bär, Eberhard, Müller, Jonas, Larrieu, Guilhem

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Thermal Simulation of Paralleled SiC PiN Diodes in a Module Designed for 6.5 kV/1 kA von Bär, Eberhard, Berwian, Patrick, Kallinger, Birgit, Bayer, Christoph Friedrich

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Process Variability-Technological Challenge and Design Issue for Nanoscale Devices von Lorenz, Jürgen, Bär, Eberhard, Barraud, Sylvain, Brown, Andrew R, Evanschitzky, Peter, Klüpfel, Fabian, Wang, Liping

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Influence of Inner Skin- and Proximity Effects on Conduction in Litz Wires von Rosskopf, Andreas, Bar, Eberhard, Joffe, Christopher

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Secondary ion mass spectrometry quantification of boron distribution in an array of silicon nanowires von Michałowski, Paweł Piotr, Müller, Jonas, Rossi, Chiara, Burenkov, Alexander, Bär, Eberhard, Larrieu, Guilhem, Pichler, Peter

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Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Methodology von Lorenz, Jürgen K., Bar, E., Clees, T., Jancke, R., Salzig, C. P. J., Selberherr, S.

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Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results von Lorenz, J. K., Bar, E., Clees, T., Evanschitzky, P., Jancke, R., Kampen, C., Paschen, U., Salzig, C. P. J., Selberherr, S.

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A fast development simulation algorithm for discrete resist models von Schnattinger, Thomas, Bär, Eberhard, Erdmann, Andreas

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3-D simulation of LPCVD using segment-based topography discretization von Bar, E., Lorenz, J.

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Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Results : CHARACTERIZATION OF NANO CMOS VARIABIALITY BY SIMULATION AND MEASUREMENTS von LORENZ, Jürgen K, BÄR, Eberhard, CLEES, Tanja, EVANSCHITZKY, Peter, JANCKE, Roland, KAMPEN, Christian, PASCHEN, Uwe, SALZIG, Christian P. J, SELBERHERR, Siegfried

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Practical Performance Model for Bar Buckling von Berry, Michael P, Eberhard, Marc O

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Process variability - technological challenge and design issue for nanoscale devices von Lorenz, Jürgen, Bär, Eberhard, Barraud, Sylvain, Brown, Andrew R, Evanschitzky, Peter, Klüpfel, Fabian, Wang, Liping

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Recruitment of Host Nuclear Pore Components to the Vicinity of Theileria Schizonts von Huber, Sandra, Bär, Anina, Epp, Selina, Schmuckli-Maurer, Jacqueline, Eberhard, Naja, Humbel, Bruno M, Hemphill, Andrew, Woods, Kerry

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Modeling of block copolymer dry etching for directed self-assembly lithography von Belete, Zelalem, Bär, Eberhard, Erdmann, Andreas

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Octahedro octahedra and tetrahedra. II. Tetra- to heptanuclear carbonyl(cyano)chromato, -molybdato and -tungstato complexes of 3d metals von Fritz, Marcus, Rieger, Dirk, Bär, Eberhard, Beck, Gerhard, Fuchs, Joachim, Holzmann, Gerhard, Fehlhammer, Wolf P.

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Hierarchical Simulation of Process Variations and Their Impact on Circuits and Systems: Methodology : CHARACTERIZATION OF NANO CMOS VARIABIALITY BY SIMULATION AND MEASUREMENTS von LORENZ, Jürgen K, BAR, Eberhard, CLEES, Tanja, JANCKE, Roland, SALZIG, Christian P. J, SELBERHERR, Siegfried

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Process variability for devices at and beyond the 7 nm node von Lorenz, Jürgen, Asenov, Asen, Bär, Eberhard, Barraud, Sylvain, Millar, Campbell, Nedjalkov, Mihail

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Albrecht der Bär, ein brandenburgisches Festspiel, von Eberhard König, aufgeführt auf dem Pichelswerden bei Spandau im Sommer 1911 durch die "Brandenburgia" Festspielleitung: Heinrich Frey von König, Eberhard, 1871-1949

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Richard Wagner - Tristan und Isolde Stephen Gould (Tristan, ten ), Nina Stemme (Isolde, sop ), Kwangchul Youn (Marke, bass ), Johan Reuter (Kurwenal, bar ), Michelle Breedt (Brangäne, mezzo ) Rundfunkchor Berlin Eberhard Friedrich, dir Rundfunk-Sinfonieorchester Berlin Marek Janowski, cond Pentatone Classics 5186404, 2012 (3 CDs: 225 minutes) von Bribitzer-Stull, Matthew

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