Blue shift and mirror degradation in InGaAsGaAs strained quantum well lasers von Serra, L., Azzini, G.A., Montangero, P.

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Blue shift and mirror degradation in [formula omitted] strained quantum well lasers von Serra, L., Azzini, G.A., Montangero, P.

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Reliability of InGaAsInP based separate absorption grading multiplication avalanche photodiodes von Montangero, P., Azzini, G.A., Neitzert, H.C., Ricci, G., Serra, L.

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The scanning optical microscope: A powerful tool for failure analysis of electronic devices von Azzini, G.A., Arman, G., Montangero, P.

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Optical-beam-induced current and photoluminescence techniques for localization of crystallographic defects in optoelectronic devices von Montangero, P., Azzini, G.A., De Franceschi, R., Mancini, M., Serra, L.

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Reliability tests and failure analysis for quality improvement in 1.5 /spl mu/m Fabry-Perot lasers von Montangero, P., Azzini, G.A., Crovato, R., Ricci, L., Serra, L.

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A SOM approach to the failure physics of optoelectronic devices von Montangero, P., Azzini, G.A., Liberatore, M., Mancini, M., Pederzini, E., Serra, L.

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Reliability of [formula omitted] based separate absorption grading multiplication avalanche photodiodes von Montangero, P., Azzini, G.A., Neitzert, H.C., Ricci, G., Serra, L.

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