New test methodology for resistive open defect detection in memory address decoders von Azimane, M., Majhi, A.K.

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Memory Testing Under Different Stress Conditions: An Industrial Evaluation von Majhi, Ananta K., Azimane, Mohamed, Gronthoud, Guido, Lousberg, Maurice, Eichenberger, Stefan, Bowen, Fred

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A new algorithm for dynamic faults detection in RAMs von Azimane, M., Majhi, A., Gronthoud, G., Lousberg, M., Eichenberger, S., Ruiz, A.L.

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High-Quality Memory Test von Azimane, M.

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Reducing test cost for mixed signal circuits "From TOETS to ELESIS" von Azimane, M.

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Word line pulsing technique for stability fault detection in SRAM cells von Pavlov, A., Azimane, M., de Gyvez, J.P., Sachdev, M.

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Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO von Dubois, T., Azimane, M., Larsson, E., Marinissen, E.J., Wielage, P., Wouters, C.

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A special march test to detect delay coupling faults for RAMs von Azimane, M., Ruiz, A.L.

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Programmable techniques for cell stability test and debug in embedded SRAMs von Pavlov, A., Sachdev, M., de Gyvez, J.P., Mohamed Azimane

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Memory testing improvements through different stress conditions von Majhi, A., Mohamed Azimane, Gronthoud, G., Lousberg, M., Eichenberger, S., Bowen, F.

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New short and efficient algorithm for testing random-access memories von Azimane, M., Ruiz, A.L.

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Pélerinages médiévaux : Saint Gilles, sur le chemin de Rome

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Pélerinages médiévaux : Saint Gilles, sur le chemin de Rome

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