Characterization of trapping states in polycrystalline-silicon thin film transistors by deep level transient spectroscopy von AYRES, J. R

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A new self-consistent model for the analysis of hot-carrier induced degradation in lightly doped drain (LDD) and gate overlapped LDD polysilicon TFTs von Valletta, A., Mariucci, L., Pecora, A., Fortunato, G., Ayres, J.R., Brotherton, S.D.

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Analysis of electrical characteristics of gate overlapped lightly doped drain (GOLDD) polysilicon thin-film transistors with different LDD doping concentration von Bonfiglietti, A., Cuscuna, M., Valletta, A., Mariucci, L., Pecora, A., Fortunato, G., Brotherton, S.D., Ayres, J.R.

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Influence of melt depth in laser crystallized poly-Si thin film transistors von Brotherton, S. D., McCulloch, D. J., Gowers, J. P., Ayres, J. R., Trainor, M. J.

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Hot carrier-induced degradation of gate overlapped lightly doped drain (GOLDD) polysilicon TFTs von Valletta, A., Mariucci, L., Fortunato, G., Brotherton, S.D., Ayres, J.R.

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Modeling of laser-annealed polysilicon TFT characteristics von Armstrong, G.A., Uppal, S., Brotherton, S.D., Ayres, J.R.

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Control and analysis of leakage currents in poly-Si thin-film transistors von Brotherton, S. D., Ayres, J. R., Trainor, M. J.

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To live and die in Arizona von Ayres, R Jack

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Numerical simulation of transient emission from deep level traps in polysilicon thin film transistors von Armstrong, G.A, Ayres, J.R, Brotherton, S.D

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Current DLTS measurements on poly-Si thin film transistors von Ayres, J.R.

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Building partnerships to respond to HIV/AIDS: non-governmental organizations and universities von PAIVA, Vera, AYRES, José Ricardo, BUCHALLA, Cassia Maria, HEARST, Norman

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Defects and leakage currents in BF2-implanted preamorphized silicon von Brotherton, S. D., Gowers, J. P., Young, N. D., Clegg, J. B., Ayres, J. R.

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Proximal interphalangeal joint arthrodesis with the Herbert screw von Ayres, John R., Goldstrohm, Gregg L., Miller, Gary J., Dell, Paul C.

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Possible superconductivity from incoherent carriers in overdoped cuprates von Culo, M., Duffy, C., Ayres, J., Berben, M., Hsu, Yi-Ting, Hinlopen, R. D. H., Bernath, B., Hussey, N. E.

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Electrically active defects in shallow pre-amorphised p+ n junctions in silicon von BROTHERTON, S. D, AYRES, J. R, CLEGG, J. B, GOWERS, J. P

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AIDS and pregnancy: meanings of risk and challenges for care von Kurokawa e Silva, Neide Emy, de Alvarenga, Augusta Thereza, de C M Ayres, José Ricardo

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A comparison of the kink effect in polysilicon thin film transistors and silicon on insulator transistors von Armstrong, G.A., Brotherton, S.D., Ayres, J.R.

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Defects in tin pre-amorphised p+n junctions in silicon von Ayres, J R, Brotherton, S D, Clegg, J B, Gill, A, Gowers, J P

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INSETOS E ÁCAROS ASSOCIADOS AO AMARELINHO NO MUNICÍPIO DE LONDRINA, PARANÁ, COM POTENCIAL PARA SEU CONTROLE BIOLÓGICO von SIMÕES, Homero Christoval, MENEZES JR, Ayres De Oliveira, DALBERTO, Fernanda Maura Sassiotti

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The problem of true knowledge in epidemiology von Ayres, J R

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