A comparison of seven geostatistically based inverse approaches to estimate transmissivities for modeling advective transport by groundwater flow von Zimmerman, D. A., Marsily, G., Gotway, C. A., Marietta, M. G., Axness, C. L., Beauheim, R. L., Bras, R. L., Carrera, J., Dagan, G., Davies, P. B., Gallegos, D. P., Galli, A., Gómez‐Hernández, J., Grindrod, P., Gutjahr, A. L., Kitanidis, P. K., Lavenue, A. M., McLaughlin, D., Neuman, S. P., RamaRao, B. S., Ravenne, C., Rubin, Y.

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Latent interface-trap buildup and its implications for hardness assurance (MOS transistors) von Schwank, J.R., Fleetwood, D.M., Shaneyfelt, M.R., Winokur, P.S., Axness, C.L., Riewe, L.C.

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Analytic light—or radiation—induced pn junction photocurrent solutions to the multidimensional ambipolar diffusion equation von Axness, C. L., Kerr, B., Wunsch, T. F.

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Modeling the time-dependent transient radiation response of semiconductor junctions von Wunsch, T.F., Axness, C.L.

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SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor von Sexton, F.W., Corbett, W.T., Treece, R.K., Hass, K.J., Hughes, K.L., Axness, C.L., Hash, G.L., Shaneyfelt, M.R., Wunsch, T.F.

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Radiation characteristics of SIPOS and polysilicon resistors von Axness, C.L., Riewe, L., Reber, R.A., Liang, A.Y., Ang, S.S., Brown, W.D.

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The 2D Steady Hydraulic Head Field Surrounding a Pumping Well in a Finite Heterogeneous Confined Aquifer von Axness, Carl L, Carrera, Jesus

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RAM cell recovery mechanisms following high-energy ion strikes von Weaver, H.T., Axness, C.L., Fu, J.S., Binkley, J.S., Mansfield, J.

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Single event upset in irradiated 16K CMOS SRAMs von AXNESS, C L, Schwank, J R, Winokur, P S, Browning, J S, Koga, R

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Memory SEU simulations using 2-D transport calculations von Fu, J.S., Axness, C.L., Weaver, H.T.

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An SEU Tolerant Memory Cell Derived from Fundamental Studies of SEU Mechanisms in SRAM von Weaver, H. T., Axness, C. L., McBrayer, J. D., Browning, J. S., Fu, J. S., Ochoa, A., Koga, R.

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SEU characterization and design dependence of the SA3300 microprocessor von Sexton, F.W., Treece, R.K., Hass, K.J., Hughes, K.L., Hash, G.L., Axness, C.L., Buchner, S.P., Kang, K.

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A proposed new structure for SEU immunity in SRAM employing drain resistance von Ochoa, A., Axness, C.L., Weaver, H.T., Fu, J.S.

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Three-dimensional stochastic analysis of macrodispersion in aquifers von Gelhar, Lynn W., Axness, Carl L.

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Upscaling transmissivity under radially convergent flow in heterogeneous media von Sánchez‐Vila, Xavier, Axness, Carl L., Carrera, Jesús

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Mechanisms Leading to Single Event Upset von Axness, C. L., Weaver, H. T., Fu, J. S., Koga, R., Kolasinski, W. A.

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Latent interface-trap buildup and its implications for hardnessassurance MOS transistors von Schwank, J R, Fleetwood, D M, Shaneyfelt, M R, Winokur, P S, Axness, C L, Riewe, L C

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Reply [to “Comment On ‘Three‐dimensional stochastic analysis of macrodispersion in aquifers’ by Lynn W. Gelhar and Carl L. Axness”] von Gelhar, L. W., Axness, C. L.

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Reply [to “Comment On ‘Three‐dimensional stochastic analysis of macrodispersion in aquifers’ by Lynn W. Gelhar and Carl L. Axness”] von Gelhar, L. W., Axness, C. L.

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Two-Dimensional Simulation of Single Event Indujced Bipolar Current in CMOS Structures von Fu, J. S., Axness, C. L., Weaver, H. T.

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