Direct measurement of the near-field super resolved focused spot in InSb von Assafrao, A C, Wachters, A J H, Verheijen, M, Nugrowati, A M, Pereira, S F, Urbach, H P, Armand, Marie-Francoise, Olivier, Segolene

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Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy von Schmidt, S, Klein, A.E, Paul, T, Gross, H, Diziain, S, Steinert, M, Assafrao, A.C, Pertsch, T, Urbach, H.P, Rockstuhl, C

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