Spectroscopic ellipsometry — Past, present, and future von Aspnes, D.E.

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Plasmonics and effective-medium theories von Aspnes, D.E.

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Expanding horizons: new developments in ellipsometry and polarimetry von Aspnes, D.E.

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External removal of endpoint-discontinuity artifacts in the reciprocal-space analysis of spectra von Le, V.L., Kim, T.J., Kim, Y.D., Aspnes, D.E.

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Follow the light: Ellipsometry and polarimetry von Arwin, Hans, Aspnes, David E.

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Optical properties of thin films von Aspnes, D.E.

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Recombination at semiconductor surfaces and interfaces von Aspnes, D.E.

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Dielectric functions and interband transitions of InxAl1 − xP alloys von Kim, T.J., Hwang, S.Y., Byun, J.S., Aspnes, D.E., Lee, E.H., Song, J.D., Liang, C.-T., Chang, Y.-C., Park, H.G., Choi, J., Kim, J.Y., Kang, Y.R., Park, J.C., Kim, Y.D.

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Eliminating noise from spectra by linear and nonlinear methods von Le, L.V., Kim, Y.D., Aspnes, D.E.

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Real-time optical diagnostics for epitaxial growth von Aspnes, D.E.

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Comparison of the capabilities of rotating-analyzer and rotating-compensator ellipsometers by measurements on a single system von Mori, T., Aspnes, D.E.

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Real-time optical analysis and control of semiconductor epitaxy: Progress and opportunity von Aspnes, D.E.

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Observation and analysis of epitaxial growth with reflectance-difference spectroscopy von Aspnes, D.E.

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Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces von Aspnes, D.E.

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Optical approaches to the determination of composition of semiconductor alloys during epitaxy von Aspnes, D.E.

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Surface-induced optical anisotropy of oxidized, clean, and hydrogenated vicinal Si(001) surfaces von Mantese, L., Rossow, U., Aspnes, D.E.

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Optical approaches for controlling epitaxial growth von Aspnes, D.E, Dietz, N

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Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information von Aspnes, D.E., Choi, S.G.

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Broadband spectral operation of a rotating-compensator ellipsometer von Opsal, J., Fanton, J., Chen, J., Leng, J., Wei, L., Uhrich, C., Senko, M., Zaiser, C., Aspnes, D.E.

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Fourier transform detection system for rotating-analyzer ellipsometers von Aspnes, D.E.

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