Postbond Test of Through-Silicon Vias With Resistive Open Defects von Rodriguez-Montanes, Rosa, Arumi, Daniel, Figueras, Joan

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Prebond Testing of Weak Defects in TSVs von Arumi, Daniel, Rodriguez-Montanes, Rosa, Figueras, Joan

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Unpredictable Bits Generation Based on RRAM Parallel Configuration von Arumi, Daniel, Gomez-Pau, Alvaro, Manich, Salvador, Rodriguez-Montanes, Rosa, Gonzalez, Mireia Bargallo, Campabadal, Francesca

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Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents von Arumi, Daniel, Rodriguez-Montanes, Rosa, Figueras, Joan

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RRAM serial configuration for the generation of random bits von Arumí, D., Gonzalez, M.B., Campabadal, F.

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Impact of Laser Attacks on the Switching Behavior of RRAM Devices von Arumí, Daniel, Manich, Salvador, Gómez-Pau, Álvaro, Rodríguez-Montañés, Rosa, Montilla, Víctor, Hernández, David, González, Mireia Bargalló, Campabadal, Francesca

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Gate Leakage Impact on Full Open Defects in Interconnect Lines von Arumi, D., Rodriguez-Montanes, Rosa, Figueras, J., Eichenberger, S., Hora, C., Kruseman, B.

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Impact of gate tunnelling leakage on CMOS circuits with full open defects von RODRIGUEZ-MONTANES, R, ARUMI, D, FIGUERAS, J, EICHENBERGER, S, HORA, C, KMSEMAN, B

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Design and validation of a platform for electromagnetic fault injection von Balasch, Josep, Arumi Delgado, Daniel, Manich Bou, Salvador

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Análisis de viabilidad de una celda de memoria enmascarable basada en RRAMs para aplicaciones de seguridad von Otaño Del Prado, Carlos Xabier

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RRAM based cell for hardware security applications von Arumi Delgado, Daniel, Manich Bou, Salvador, Rodríguez Montañés, Rosa

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RRAM Based Random Bit Generation for Hardware Security Applications von Arumi Delgado, Daniel, Rodríguez Montañés, Rosa, Manich Bou, Salvador, Pehl, Michael

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Anàlisi d'associacions de memristors per a la generació de bits aleatoris per aplicacions de seguretat hardware von Serrano Carranco, Maitane

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Post-Bond test of through-silicon vias with open defects von Rodríguez Montañés, Rosa, Arumi Delgado, Daniel, Figueras Pàmies, Joan

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Millora de la penetració en algoritmes simètrics mitjançant l'anàlisi diferencial de potència d'ordre superior (HO-DPA) von Piris Burgos, Miquel

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BIST architecture to detect defects in tsvs during pre-bond testing von Arumi, Daniel, Rodríguez-Montañes, Rosa, Figueras, Joan

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Resistive open defect characteritzation in 3D 6T SRAM memories von Castillo, Raúl, Arumi Delgado, Daniel, Rodríguez Montañés, Rosa

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Backside polishing detector: a new protection against backside attacks von Manich Bou, Salvador, Arumi Delgado, Daniel, Rodríguez Montañés, Rosa, Mujal Colell, Jordi, Hernández García, David

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8T SRAM Cell with Open Defects under Voltage and Timing Variations von Rodríguez Montañés, Rosa, Arumi Delgado, Daniel, Figueras Pàmies, Joan, Castillo Muñoz, Raul

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Enhancement of defect diagnosis based on the analysis of CMOS DUT behaviour von Arumí i Delgado, Daniel

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