Nanoimaging with a compact extreme-ultraviolet laser von Vaschenko, G, Brizuela, F, Brewer, C, Grisham, M, Mancini, H, Menoni, C S, Marconi, M C, Rocca, J J, Chao, W, Liddle, J A, Anderson, E H, Attwood, D T, Vinogradov, A V, Artioukov, I A, Pershyn, Y P, Kondratenko, V V

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Focusing of a tabletop soft-x-ray laser beam and laser ablation von Benware, B R, Ozols, A, Rocca, J J, Artioukov, I A, Kondratenko, V V, Vinogradov, A V

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Damage to extreme-ultraviolet Sc/Si multilayer mirrors exposed to intense 46.9-nm laser pulses von Grisham, M, Vaschenko, G, Menoni, C S, Rocca, J J, Pershyn, Yu P, Zubarev, E N, Voronov, D L, Sevryukova, V A, Kondratenko, V V, Vinogradov, A V, Artioukov, I A

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Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser von Artioukov, I.A., Benware, B.R., Rocca, J.J., Forsythe, M., Uspenskii, Yu.A., Vinogradov, A.V.

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Schwarzschild soft-x-ray microscope for imaging of nonradiating objects von Artioukov, I A, Vinogradov, A V, Asadchikov, V E, Kas'yanov, Y S, Serov, R V, Fedorenko, A I, Kondratenko, V V, Yulin, S A

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Mechanisms of radiation damage to Sc/Si multilayer mirrors under EUV laser irradiation von Pershyn, Y P, Zubarev, E N, Voronov, D L, Sevryukova, V A, Kondratenko, V V, Vaschenko, G, Grisham, M, Menoni, C S, Rocca, J J, Artioukov, I A, Uspenskii, Y A, Vinogradov, A V

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Reflection mode imaging with nanoscale resolution using a compact extreme ultraviolet laser von Brizuela, F, Vaschenko, G, Brewer, C, Grisham, M, Menoni, C, Marconi, M, Rocca, J, Chao, W, Liddle, J, Anderson, E, Attwood, D, Vinogradov, A, Artioukov, I, Pershyn, Y, Kondratenko, V

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Soft X-ray multilayer mirrors based on depleted uranium von Artioukov, I.A., Fechtchenko, R.M., Udovskii, A.L., Uspenskii, Yu.A., Vinogradov, A.V.

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Scandium/carbon filters for soft x rays von Artioukov, I. A., Kasyanov, Yu. S., Kopylets, I. A., Pershin, Yu. P., Romanova, S. A.

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Experimental research of stability of thin films on the basis of depleted uranium as reflecting coating for wavelength of 4.5 nm von Artioukov, I.A., Chefonov, O.V., Gilev, O.N., Lipin, A.V., Ostashev, V.I., Potapov, A.V., Pronin, V.A., Svyatov, I.L., Vikhlyaev, D.A., Vinogradov, A.V.

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Thermoresistive multilayer mirrors with antidiffusion barriers for work at the wavelengths 40-50 nm von Voronov, D L, Zubarev, E N, Kondratenko, V V, Penkov, A V, Pershin, Y P, Ponomarenko, A G, Artioukov, I A, Vinogradov, A V, Uspenskii, Y A, Seely, J F

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Single-shot imaging of nanoscale dynamics by extreme ultraviolet microscopy von Carbajo, S., Brizuela, F., Sakdinawat, A., Liu, Y. W., Chao, W., Anderson, E. H., Vinogradov, A. V., Artioukov, I. A., Attwood, D. T., Marconi, M. C., Rocca, J. J., Buchanan, K., Menoni, C. S.

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Mechanisms of radiation damage to Sc/Si multilayer mirrors under EUV laser irradiation von PERSHYN, Y. P, ZUBAREV, E. N, USPENSKII, Y. A, VINOGRADOV, A. V, VORONOV, D. L, SEVRYUKOVA, V. A, KONDRATENKO, V. V, VASCHENKO, G, GRISHAM, M, MENONI, C. S, ROCCA, J. J, ARTIOUKOV, I. A

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Effects of a Near-Surface Transition Layer on X-Ray Reflection and Scattering von Artioukov, Igor A., Asadchikov, Viktor E., Kozhevnikov, Igor V.

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Nanoimaging with a compact extreme-ultraviolet laser von VASCHENKO, G, BRIZUELA, F, ANDERSON, E. H, ATTWOOD, D. T, VINOGRADOV, A. V, ARTIOUKOV, I. A, PERSHYN, Y. P, KONDRATENKO, V. V, BREWER, C, GRISHAM, M, MANCINI, H, MENONI, C. S, MARCONI, M. C, ROCCA, J. J, CHAO, W, LIDDLE, J. A

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Effects of a Near-Surface Transition Layer on X-Ray Reflection and Scattering von Artioukov, Igor A., Asadchikov, Viktor E., Kozhevnikov, Igor V.

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Nanoscale Resolution Microscopy and Ablation with Extreme Ultraviolet Lasers von Menoni, C.S., Brizuela, F., Brewer, C., Bravo, H., Langdon, B., Martz, D., Vaschenko, G., Luther, B., Marconi, M.C., Rocca, J.J., Chao, W., Anderson, E.H., Attwood, D.T., Vinogradov, A.V., Artioukov, I.A., Pershyn, Y.P., Kondratenko, V.V.

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Advances in Nanoscale Resolution Soft X-Ray Laser Microscopy von Menoni, C. S., Brizuela, F., Brewer, C., Martz, D., Wachulak, P., Jimenez, S. Fernandez, Marconi, M. C., Rocca, J. J., Chao, W., Anderson, E. H., Attwood, D. T., Vinogradov, A. V., Artioukov, I. A., Pershyn, Y. P., Kondratenko, V. V.

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Nanometer-scale resolution microscopy with compact extreme ultraviolet lasers von Menoni, C.S., Vaschenko, G., Brizuela, F., Brewer, C., Wang, Y., Larotonda, M.A., Luther, B.M., Marconi, M.C., Rocca, J.J., Chao, W., Liddle, J.A., Liu, Y., Anderson, E.H., Attwood, D.T., Vinogradov, A.V., Artioukov, I.A., Pershyn, Y.P., Kondratenko, V.V.

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Nano-scale imaging with a compact EUV laser von Vaschenko, G., Brizuela, F., Brewer, C., Grisham, M., Mancini, H., Menoni, C.S., Marconi, M., Rocca, J.J., Chao, W., Liddle, A., Anderson, E., Attwood, D., Vinogradov, A.V., Artioukov, I.A., Pershyn, Yu.P., Kondratenko, V.V.

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