Backgating effect in III–V MESFET’s: A physical model von Manifacier, J.C., Ardebili, R.

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A new perspective on MHD mode identification of IR-T1 tokamak plasma by frequency filtering and fitting method von Ghanbari, M.R., Ghoranneviss, M., Noorizadeh Ardebili, M.R.

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Backgating effect in IIIaV MESFETas: A physical model von Manifacier, J C, Ardebili, R

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BULK AND CONTACT EFFECTS IN P(+)-SI-N(+) SEMIINSULATING GAAS STRUCTURES von Manifacier, J.-C., Ardebili, R.

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High level injection phenomena in P–N junctions von Manifacier, J. C., Ardebili, R., Popescu, C.

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Process Simulation: When Programming is Easier Than User-Friendly Packages von Ardebili, Z.R., Manenti, F.

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I-V Curve Shape Factor for Thin p-n Junctions at High Injection Levels von Popescu, C., Manifacier, J. C., Ardebili, R.

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Current Induced Potential Well in Compensated Semiconductors von Manifacier, J. C., Ardebili, R.

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Improved solar cells modelling: An object oriented approach von Moreau, Y., Pélanchon, F., Ardebili, R.

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Bulk and contact effects in p +-SI- n + semi-insulating GaAs structures von Manifacier, J. C., Ardebili, R.

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Mesh optimization for the numerical simulation of ambipolar transport in low lifetime semiconductor structures von Ardebili, R., Manifacier, J.C.

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SCHOTTKY DIODE - COMMENTS CONCERNING THE DIODE PARAMETERS DETERMINATION FROM THE FORWARD IV PLOT von Manifacier, J.-C., Brortryb, N., Ardebili, R., Charles, J.-P.

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Schottky diode: comments concerning the diode parameters determination from the forward I-V plot von MANIFACIER, J.-C, BRORTRYB, N, ARDEBILI, R, CHARLES, J.-P

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Influence of the surface roughness on the determination of the optical parameters of SnO2 thin films von ARDEBILI, R, CHARLES, J.-P, MARTIN, L, MARUCCHI, J, MANIFACIER, J.-C

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Travaux Pratiques en Traitement Numérique du Signal au département GEII de l'IUT de Montpellier von Ardebili, R., Delauzun, JP

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Influence of the surface roughness on the determination of the optical parameters of SnO sub 2 thin films von Ardebili, R, Charles, J-P, Martin, L

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Indium tin oxide/(n +-p) silicon solar cell von Chaoui, A., Ardebili, R., Manifacier, J.C.

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Influence of the surface roughness on the determination of the optical parameters of SnO 2 thin films von Ardebili, R., Charles, J.-P., Martin, L., Marucchi, J., Manifacier, J.-C.

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FEM-based parametric analysis of a typical gravity dam considering input excitation mechanism von Hariri-Ardebili, M.A., Seyed-Kolbadi, S.M., Kianoush, M.R.

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Comparative studies of the sensitivities of sparse and full geometries of Total-Body PET scanners built from crystals and plastic scintillators von Dadgar, M., Parzych, S., Baran, J., Chug, N., Curceanu, C., Czerwiński, E., Dulski, K., Elyan, K., Gajos, A., Hiesmayr, B. C., Kapłon, Ł., Klimaszewski, K., Konieczka, P., Korcyl, G., Kozik, T., Krzemien, W., Kumar, D., Niedzwiecki, S., Panek, D., Perez del Rio, E., Raczyński, L., Sharma, S., Shivani, S., Shopa, R. Y., Skurzok, M., Stepień, E. Ł., Tayefi Ardebili, F., Tayefi Ardebili, K., Vandenberghe, S., Wiślicki, W., Moskal, P.

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