Zn concentration determination in CdZnTe by NIR spectroscopy von Maxey, C.D., Gower, J.E., Capper, P., O'Keefe, E.S., Skauli, T., Ard, C.K.

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Bridgman growth and assessment of CdTe and CdZnTe using the accelerated crucible rotation technique von Capper, P., Harris, J.E., O'Keefe, E., Jones, C.L., Ard, C.K., Mackett, P., Dutton, D.

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Effect of ACRT rotation parameters on Bridgman grown CdxHg1− xTe crystals von Coates, W.G., Capper, P., Jones, C.L., Gosney, J.J.G., Ard, C.K., Kenworthy, I., Clark, A.

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Effect of process changes on the properties of CdxHg1-xTe crystals grown by Bridgman using ACRT von CAPPER, P, COATES, W. G, JONES, C. L, GOSNEY, J. J. G, KENWORTHY, I, ARD, C. K

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Effect of process changes on the properties of Cd xHg 1−xTe crystals grown by Bridgman using ACRT von Capper, P., Coates, W.G., Jones, C.L., Gosney, J.J.G., Kenworthy, I., Ard, C.K.

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Quenching studies in CdxHg1-xTe crystals grown using ACRT von CAPPER, P, COATES, W. G, JONES, C. L, GOSNEY, J. J, ARD, C. K, KENWORTHY, I

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Impurity segregation in CdxHg1-xTe crystals grown using ACRT von CAPPER, P, GALE, I. G, GRAINGER, F, ROBERTS, J. A, JONES, C. L, GOSNEY, J. J. G, KENWORTHY, I, ARD, C. K, COATES, W. G

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Quenching studies in Cd xHg 1− xTe crystals grown using ACRT von Capper, P., Coates, W.G., Jones, C.L., Gosney, J.J., Ard, C.K., Kenworthy, I.

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Impurity segregation in Cd xHg 1- xTe crystals grown using ACRT von Capper, P., Gale, I.G., Grainger, F., Roberts, J.A., Jones, C.L., Gosney, J.J.G., Kenworthy, I., Ard, C.K., Coates, W.G.

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