Mechanism of the Transfer of AuCl4 – and TOA+ Ions Across the Liquid/Liquid Interface von Duong, Quynh, Tan, Yunshi, Corey, Jason, Anz, Samir, Sun, Peng

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Potentiometric Study of the Growth of a Single Au Nanoparticle von Yao, Zhiqi, Wu, Shu, Padilla Silvas, Raul, Khichoomian, Nareh, Carrillo, Zachary A., Anz, Samir, Sun, Peng

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The higher fullerenes : isolation and characterization of C76, C84, C90, C94 and C70O, an oxide of D5h-C70 von DIEDERICH, F, ETTL, R, KOCH, A, RUBIN, Y, WHETTEN, R. L, BECK, R, ALVAREZ, M, ANZ, S, SENSHARMA, D, WUDL, F, KHEMANI, K. C

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Damage-free Pattern Transfer by Low Energy Electron Enhanced Etching (LE4): Mechanisms and Applications von Gillis, H.P., Anz, Samir, Demine, Matthew

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Mechanism of the Transfer of AuCl 4 – and TOA + Ions Across the Liquid/Liquid Interface von Duong, Quynh, Tan, Yunshi, Corey, Jason, Anz, Samir, Sun, Peng

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Evaluation of the Stoichiometry between PtCl 6 2− and TOA + Ions during the Liquid/Liquid Extraction von Wu, Shu, Nguyen, Linh, Dang, Jenny, Liang, Kevin, Dail, Christopher, Henriquez, Brenda, Huynh, Quyen T., Dinh, Uyen N., Liang, Yuhao, Anz, Samir, Sun, Peng

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Voltammetry of Ferrocenated Gold Nanoparticles on a Nanometer-Sized Electrode von Sun, Peng, Sun, Tong, Anz, Samir, Corey, Jason, Tan, Yunshi

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Evaluation of the Stoichiometry between PtCl62− and TOA+ Ions during the Liquid/Liquid Extraction von Wu, Shu, Nguyen, Linh, Dang, Jenny, Liang, Kevin, Dail, Christopher, Henriquez, Brenda, Huynh, Quyen T., Dinh, Uyen N., Liang, Yuhao, Anz, Samir, Sun, Peng

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Voltammetry on a Nanometer-sized Electrode in Solution Containing Very Dilute Electroactive Species von Sun, Peng, Kitt, Jordan, Tran, Nina, Dang, Jennytruc, Saavedra, Daniel P., Hong, Jungik, Wampler, Rachel, Anz, Samir

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Characterization of the soluble all-carbon molecules C60 and C70 von Ajie, Henry, Alvarez, Marcos M, Anz, Samir J, Beck, Rainer D, Diederich, Francois, Fostiropoulos, K, Huffman, Donald R, Kraetschmer, Wolfgang, Rubin, Yves, et al, .

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Simulations of the Steady-State Current Density vs Potential Characteristics of Semiconducting Electrodes von Anz, Samir J, Lewis, Nathan S

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Conditions Under Which Heterogeneous Charge-Transfer Rate Constants Can Be Extracted from Transient Photoluminescence Decay Data of Semiconductor/Liquid Contacts As Determined by T... von Anz, Samir J, Krüger, Olaf, Lewis, Nathan S, Gajewski, Herbert

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Precision, Damage-Free Etching by Electron-Enhanced Reactions: Results and Simulations von Gillis, H.P., Anz, Samir J., Han, Si-Ping, Su, Julius, Goddard, William A.

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Atomic force microscope studies of fullerene films - Highly stable C60 fcc (311) free surfaces von Snyder, Eric J., Tong, William M., Williams, R. S., Anz, Samir J., Anderson, Mark S.

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DC PLASMA CONTROL FOR ELECTRON ENHANCED MATERIAL PROCESSING von SANDO, Stewart Francis, MARGOLESE, David Irwin, ANZ, Samir John, GODDARD, William Andrew

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Electron bias control signals for electron enhanced material processing von Anz, Samir John, Sando, Stewart Francis, Goddard, William Andrew, Margolese, David Irwin

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COMPOSITE STAGE FOR ELECTRON ENHANCED MATERIAL PROCESSING von SANDO, Stewart Francis, MARGOLESE, David Irwin, ANZ, Samir John, GODDARD, William Andrew

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COMPOSITE STAGE FOR ELECTRON ENHANCED MATERIAL PROCESSING von Anz, Samir John, Sando, Stewart Francis, Goddard, William Andrew, Margolese, David Irwin

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Atomic layer etching by electron wavefront von Anz, Samir John, Sando, Stewart Francis, Goddard, William Andrew, Margolese, David Irwin

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ELECTRON BIAS CONTROL SIGNALS FOR ELECTRON ENHANCED MATERIAL PROCESSING von Anz, Samir John, Sando, Stewart Francis, Goddard, William Andrew, Margolese, David Irwin

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