80‐1: Analysis of Side‐By‐Side RGB OLED Notebook Module Costs Patterned by Photolithography Compared to Conventional Fine Metal Mask Fabrication von Annis, Charles A.

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9‐4: Applying FPD panel and manufacturing technologies to high growth segments, alternative applications, and new business models von Annis, Charles A.

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55‐1: Roadmapping Strategies for Rapidly Diversifying FPD Applications and Manufacturing Technologies von Annis, Charles A.

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50‐1: Invited Paper: Integration of Key Components into the Panel: Adding Value and Increasing Performance of FPDs von Annis, Charles A.

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P‐71: Cost Analysis of a‐Si and Organic Semiconductor Based TFT Backplanes for FPDs von Annis, Charles A.

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Influence of sample characteristics on probability of detection curves von Charles, Annis P E

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Optimal sample size for probability of detection curves von Annis, Charles, Gandossi, Luca, Martin, Oliver

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Antimalarial Activities of Polyhydroxyphenyl and Hydroxamic Acid Derivatives von HOLLAND, K. P, ELFORD, H. L, BRACCHI, V, ANNIS, C. G, SCHUSTER, S. M, CHAKRABARTI, D

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Best practices for evaluating the capability of nondestructive evaluation (NDE) and structural health monitoring (SHM) techniques for damage characterization von Aldrin, John C., Annis, Charles, Sabbagh, Harold A., Lindgren, Eric A.

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Stochastic inverse problems: Models and metrics von Sabbagh, Elias H., Sabbagh, Harold A., Murphy, R. Kim, Aldrin, John C., Annis, Charles, Knopp, Jeremy S.

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Assessing the reliability of nondestructive evaluation methods for damage characterization von Aldrin, John C, Annis, Charles, Sabbagh, Harold A, Knopp, Jeremy S, Lindgren, Eric A

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Discussion von Annis, Charles

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[Estimating Fatigue Curves with the Random Fatigue-Limit Model]: Discussion von Annis, Charles

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[Estimating Fatigue Curves with the Random Fatigue-Limit Model]: Discussion von Annis, Charles

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Discussion von Annis, Charles

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Cautionary Aspects of Applied Probabilistics von Annis, Charles

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Estimating fatigue curves with the random fatigue-limit model / discussion / response von Pascual, Francis G, Meeker, William Q, Annis, Charles, Kvam, Paul H

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Nondestructive Evaluation (NDE) Technology Initiatives (NTIP). Delivery Order 0039: Statistical Comparison of Competing Material Models von Annis, Charles

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Comparing The Effectiveness of a90/95 Calculations (Preprint) von Annis, Charles, Knopp, Jeremy

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Best Practices for Evaluating the Capability of Nondestructive Evaluation (NDE) and Structural Health Monitoring (SHM) Techniques for Damage Characterization (Post-Print) von Lindgren,Eric A, Aldrin,John C, Annis,Charles, Sabbagh,Harold A

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