Superconducting metamaterials von Ricci, Michael, Orloff, Nathan, Anlage, Steven M.

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Universal impedance fluctuations in wave chaotic systems von HEMMADY, Sameer, XING ZHENG, OTT, Edward, ANTONSEN, Thomas M, ANLAGE, Steven M

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Measurement of resonant frequency and quality factor of microwave resonators: Comparison of methods von Petersan, Paul J., Anlage, Steven M.

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A novel STM-assisted microwave microscope with capacitance and loss imaging capability von Imtiaz, Atif, Anlage, Steven M.

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Microwave electrodynamics of electron-doped cuprate superconductors von Kokales, JD, Fournier, P, Mercaldo, LV, Talanov, VV, Greene, RL, Anlage, SM

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Near-field microwave microscopy on nanometer length scales von Imtiaz, Atif, Pollak, Marc, Anlage, Steven M., Barry, John D., Melngailis, John

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Wave Chaos Experiments with and without Time Reversal Symmetry: GUE and GOE Statistics von So, P, Anlage, SM, Ott, E, Oerter, RN

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Spatially-resolved nonlinearity measurements of YBa2Cu3O7−δ bicrystal grain boundaries von Lee, Sheng-Chiang, Anlage, Steven M.

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Doping-dependent nonlinear Meissner effect and spontaneous currents in high- T c superconductors von Lee, Sheng-Chiang, Sullivan, Mathew, Ruchti, Gregory R., Anlage, Steven M., Palmer, Benjamin S., Maiorov, B., Osquiguil, E.

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Influence of LaAlO3 surface topography on rf current distribution in superconducting microwave devices von Zhuravel, A. P., Ustinov, A. V., Harshavardhan, K. S., Anlage, Steven M.

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Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films von Steinhauer, D. E., Vlahacos, C. P., Wellstood, F. C., Anlage, Steven M., Canedy, C., Ramesh, R., Stanishevsky, A., Melngailis, J.

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Probability Amplitude Fluctuations in Experimental Wave Chaotic Eigenmodes with and Without Time-Reversal Symmetry von Wu, Dong Ho, Bridgewater, Jesse S. A., Gokirmak, Ali, Anlage, Steven M.

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Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope von Steinhauer, D. E., Vlahacos, C. P., Wellstood, F. C., Anlage, Steven M., Canedy, C., Ramesh, R., Stanishevsky, A., Melngailis, J.

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Quantitative imaging of sheet resistance with a scanning near-field microwave microscope von Steinhauer, D. E., Vlahacos, C. P., Dutta, S. K., Feenstra, B. J., Wellstood, F. C., Anlage, Steven M.

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Near-field microwave microscope with improved sensitivity and spatial resolution von Tselev, Alexander, Anlage, Steven M., Christen, Hans M., Moreland, Robert L., Talanov, Vladimir V., Schwartz, Andrew R.

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Near-field scanning microwave microscope with 100 μm resolution von Vlahacos, C. P., Black, R. C., Anlage, S. M., Amar, A., Wellstood, F. C.

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Temperature dependence of penetration depth and surface resistance of Nd1.85Ce0.15CuO4 von DONG HO WU, JIAN MAO, MAO, S. N, PENG, J. L, XI, X. X, VENKATESAN, T, GREENE, R. L, ANLAGE, S. M

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Effects of UHF stimulus and negative feedback on nonlinear circuits von de Moraes, R.M., Anlage, S.M.

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Surface resistance imaging with a scanning near-field microwave microscope von Steinhauer, D. E., Vlahacos, C. P., Dutta, S. K., Wellstood, F. C., Anlage, Steven M.

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Imaging local sources of intermodulation in superconducting microwave devices von Zhuravel, A.P., Ustinov, A.V., Abraimov, D., Anlage, S.M.

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