The Schonland Micro-Scanning Ion Beam Analysis Facility von Andeweg, A.H., Ballestrero, S., Beer, J.U.M., Butler, J.E., Breese, M.B.H., Connell, S.H., Dini, L., Doyle, B.P., Drummond, M.L., Formenti, P., Hart, R.J., Machi, I.Z., Maclear, R.D., McQueen, I.D., Schaaff, P., Sideras-Haddad, E., Sellschop, J.P.F., Wernick, G.

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A gain monitor and calibrator for a single-channel pulse height analyser von Andeweg, A.H., Sellschop, J.P.F.

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Innovative features of the Schonland proton microprobe von Watterson, J.I.W., Fearick, R.W., Connell, S.H., Annegarn, H.J., Przybylowicz, W.J., Andeweg, A.H., McQueen, I., Sellschop, J.P.F.

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The new Schonland PIXE microprobe and applications to geological and archaeological samples von Przybylowicz, W.J., Watterson, J.I.W., Annegarn, H.J., Connell, S.H., Fearick, R.W., Andeweg, A.H., Sellschop, J.P.F.

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Charged particle induced delayed X-rays (DEX) for the analysis of intermediate and heavy elements von Pillay, A.E., Erasmus, C.S., Andeweg, A.H., Sellschop, J.P.F., Annegarn, H.J., Dunn, J.

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Ion beams for the production of neutrons and their use in selective activation analysis von Watterson, J.I.W., Pillay, A.E., Sellschop, J.P.F., Andeweg, A.H.

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