Fault equivalence identification in combinational circuits using implication and evaluation techniques von Amyeen, M.E., Fuchs, W.K., Pomeranz, I., Boppana, V.

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Microprocessor system failures debug and fault isolation methodology von Amyeen, M.E., Venkataraman, S., Mun Wai Mak

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Prioritizing the Application of DFM Guidelines Based on the Detectability of Systematic Defects von Dongok Kim, Pomeranz, I., Amyeen, M.E., Venkataraman, S.

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Evaluation of the quality of N-detect scan ATPG patterns on a processor von Amyeen, M.E., Venkataraman, S., Ojha, A., Sangbong Lee

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Dominance based analysis for large volume production fail diagnosis von Seshadri, B., Pomeranz, I., Venkataraman, S., Amyeen, M.E., Reddy, S.M.

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Testing for systematic defects based on DFM guidelines von Dongok Kim, Amyeen, M.E., Venkataraman, S., Pomeranz, I., Basumallick, S., Landau, B.

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3 is a more promising algorithmic parameter than 2 von Kaykobad, M, Islam, Md.M, Amyeen, M.E, Murshed, M.M

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Fault equivalence identification using redundancy information and static and dynamic extraction von Amyeen, M.E., Fuchs, W.K., Pomeranz, I., Boppana, V.

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