Effect of Well and Substrate Potential Modulation on Single Event Pulse Shape in Deep Submicron CMOS von DasGupta, S., Witulski, A.F., Bhuva, B.L., Alles, M.L., Reed, R.A., Amusan, O.A., Ahlbin, J.R., Schrimpf, R.D., Massengill, L.W.

Volltext

Laser Verification of Charge Sharing in a 90 nm Bulk CMOS Process von Amusan, O.A., Casey, M.C., Bhuva, B.L., McMorrow, D., Gadlage, M.J., Melinger, J.S., Massengill, L.W.

Volltext

Propagating SET Characterization Technique for Digital CMOS Libraries von Baze, M.P., Wert, J., Clement, J.W., Hubert, M.G., Witulski, A., Amusan, O.A., Massengill, L., McMorrow, D.

Volltext

Charge Collection and Charge Sharing in a 130 nm CMOS Technology von Amusan, O.A., Witulski, A.F., Massengill, L.W., Bhuva, B.L., Fleming, P.R., Alles, M.L., Sternberg, A.L., Black, J.D., Schrimpf, R.D.

Volltext

A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit von Kauppila, J.S., Sternberg, A.L., Alles, M.L., Francis, A.M., Holmes, J., Amusan, O.A., Massengill, L.W.

Volltext

Single Event-Induced Error Propagation Through Nominally-off Transmission Gates von Hutson, J.M., Ramachandran, V., Bhuva, B.L., Zhu, X., Schrimpf, R.D., Amusan, O.A., Massengill, L.M.

Volltext

Effect of the integrated use of legume residue, poultry manure and inorganic fertilizers on maize yield, nutrient uptake and soil properties von Amusan, A. O., Adetunji, M. T., Azeez, J. O., Bodunde, J. G.

Volltext

C-CREST Technique for Combinational Logic SET Testing von Ahlbin, J.R., Black, J.D., Massengill, L.W., Amusan, O.A., Balasubramanian, A., Casey, M.C., Black, D.A., McCurdy, M.W., Reed, R.A., Bhuva, B.L.

Volltext

Effects of Random Dopant Fluctuations (RDF) on the Single Event Vulnerability of 90 and 65 nm CMOS Technologies von Balasubramanian, A., Fleming, P.R., Bhuva, B.L., Amusan, O.A., Massengill, L.W.

Volltext

Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low Power von Casey, M.C., Amusan, O.A., Nation, S.A., Loveless, T.D., Balasubramanian, A., Bhuva, B.L., Reed, R.A., McMorrow, D., Weller, R.A., Alles, M.L., Massengill, L.W., Melinger, J.S., Narasimham, B.

Volltext

Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic Gates von Casey, M.C., Bhuva, B.L., Black, J.D., Massengill, L.W., Amusan, O.A., Witulski, A.F.

Volltext

Knowledge, attitudes to HIV AIDS and sexual behaviour of students in a tertiary institution in south-western Nigeria von Odu, O. O., Asekun-Olarinmoye, E. O., Bamidele, J. O., Egbewale, B. E., Amusan, O. A., Olowu, A. O.

Volltext

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies von Narasimham, B., Bhuva, B.L., Schrimpf, R.D., Massengill, L.W., Gadlage, M.J., Amusan, O.A., Holman, W.T., Witulski, A.F., Robinson, W.H., Black, J.D., Benedetto, J.M., Eaton, P.H.

Volltext

The Impact Of Soil Quality On Cocoa Yield In Nigeria von Amusan, O A, Amusan, F O

Volltext

Design Techniques to Reduce SET Pulse Widths in Deep-Submicron Combinational Logic von Amusan, O.A., Massengill, L.W., Bhuva, B.L., DasGupta, S., Witulski, A.F., Ahlbin, J.R.

Volltext

Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology von Olson, B.D., Amusan, O.A., Dasgupta, S., Massengill, L.W., Witulski, A.F., Bhuva, B.L., Alles, M.L., Warren, K.M., Ball, D.R.

Volltext

Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing von Amusan, O.A., Massengill, L.W., Baze, M.P., Bhuva, B.L., Witulski, A.F., DasGupta, S., Sternberg, A.L., Fleming, P.R., Heath, C.C., Alles, M.L.

Volltext

Test circuit for measuring single-event-induced charge sharing in deep-submicron technologies von Amusan, O A, Bhuva, B L, Casey, M C, Gadlage, M J, McMorrow, D, Melinger, J S, Massengill, L W

Volltext

Soft-Error Charge-Sharing Mechanisms at Sub-100nm Technology Nodes von Massengill, L.W., Amusan, O.A., Dasgupta, S., Sternberg, A.L., Black, J.D., Witulski, A.F., Bhuva, B.L., Alles, M.L.

Volltext

Morphological and microsatellite DNA diversity of Nigerian indigenous sheep von Agaviezor, Brilliant O, Peters, Sunday O, Adefenwa, Mufliat A, Yakubu, Abdulmojeed, Adebambo, Olufunmilayo A, Ozoje, Michael O, Ikeobi, Christian ON, Wheto, Matthew, Ajayi, Oyeyemi O, Amusan, Samuel A, Ekundayo, Oludotun J, Sanni, Timothy M, Okpeku, Moses, Onasanya, Gbolabo O, De Donato, Marcos, Ilori, Babatunde M, Kizilkaya, Kadir, Imumorin, Ikhide G

Volltext