Time-dependent carrier flow in a transistor structure under nonisothermal conditions von Alwin, V.C., Navon, D.H., Turgeon, L.J.

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Emitter-junction temperature measurement under nonuniform current and temperature distribution von Alwin, V.C., Navon, D.H.

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Microstructural characteristics of spray formed and heat treated Al–(Y, La)–Ni–Co system von Srivastava, V.C., Surreddi, K.B., Scudino, S., Schowalter, M., Uhlenwinkel, V., Schulz, A., Eckert, J., Rosenauer, A., Zoch, H.-W.

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